L. Lin

NBTI Lifetime Prediction and Kinetics at Operation Bias Based on Ultrafast Pulse Measurement

B. Kaczer, G. Groeseneken, Z. Ji, 2010, IEEE Transactions on Electron Devices.

Wet dielectric separation

L. Lin, L. Benguigui, 1977 .

A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias

S. De Gendt, G. Groeseneken, B. Kaczer, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States

Zhigang Ji, Jian Fu Zhang, Wei Dong Zhang, 2011, IEEE Transactions on Electron Devices.