D. Lin

ESD sensitivity and VLSI technology trends: thermal breakdown and dielectric breakdown

D. Lin, 1994 .

Effect of VLSI technology scaling on ESD current-carrying capability

Don L. Lin, D. Lin, 1997 .

Thermal breakdown of VLSI by ESD pulses

D. L. Lin, D. Lin, 1990, 28th Annual Proceedings on Reliability Physics Symposium.