E. Ibe
发表
E. Ibe,
H. Taniguchi,
Y. Yahagi,
2010,
IEEE Transactions on Electron Devices.
K. Ishibashi,
E. Ibe,
K. Osada,
2003,
2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..
K. Ishibashi,
E. Ibe,
K. Osada,
2003,
IEEE J. Solid State Circuits.
Takashi S. Nakamura,
E. Ibe,
Y. Yahagi,
2008
.
E. Ibe,
T. Suga,
N. Kanekawa,
2011
.
H. Kameyama,
E. Ibe,
Y. Yahagi,
2005,
2005 8th European Conference on Radiation and Its Effects on Components and Systems.
E. Ibe,
2014
.
E. Ibe,
S. Uchida,
1985
.
E. Ibe,
Y. Nishino,
T. Yasuda,
1997
.
E. Ibe,
S. Uchida,
M. Utamura,
1989
.
E. Ibe,
H. Tagawa,
M. Nagase,
1989
.
E. Ibe,
Yamamoto Hajime,
A. Suzuoki,
1986
.
E. Ibe,
Shigeru Izumi,
Moriaki Tsukamoto,
1979
.
E. Ibe,
Y. Etoh,
M. Sakagami,
1987
.
E. Ibe,
Y. Etoh,
S. Uchida,
1991
.
E. Ibe,
M. Sakagami,
S. Uchida,
1986
.
E. Ibe,
S. Uchida,
1985
.
H. Kameyama,
T. Akioka,
H. Yamaguchi,
2007,
IEEE Transactions on Nuclear Science.
E. Ibe,
Y. Yahagi,
M. Baba,
2007,
Radiation protection dosimetry.
E. Ibe,
1989
.
R. L. Cowan,
E. Ibe,
T. Honda,
1985
.
Nobuyasu Kanekawa,
Takashi Suga,
Yutaka Uematsu,
2010
.
Eishi Ibe,
Kenichi Osada,
E. Ibe,
2011
.
E. Ibe,
M. Fuse,
S. Uchida,
1995
.
Shusuke Yoshimoto,
Hiroshi Kawaguchi,
Yukio Mitsuyama,
2018,
VLSI Design and Test for Systems Dependability.
E. Ibe,
S. Uchida,
1985
.
Nobuyasu Kanekawa,
Eishi Ibe,
Takashi Suga,
2011
.
Eishi Ibe,
Tadanobu Toba,
Hitoshi Taniguchi,
2012,
2012 IEEE 18th International On-Line Testing Symposium (IOLTS).
H. Kameyama,
T. Nakamura,
M. Hidaka,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.