Tadanobu Toba

Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

E. Ibe, H. Taniguchi, Y. Yahagi, 2010, IEEE Transactions on Electron Devices.

Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections

Tadanobu Toba, T. Uezono, Hiroaki Itsuji, 2022, 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Analyzing DUE Errors on GPUs With Neutron Irradiation Test and Fault Injection to Control Flow

Tadanobu Toba, T. Uezono, Kojiro Ito, 2021, IEEE Transactions on Nuclear Science.

Constructing Application-level GPU Error Rate Model with Neutron Irradiation Experiment

Tadanobu Toba, T. Uezono, Kojiro Ito, 2022, 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons

Eishi Ibe, Tadanobu Toba, Hitoshi Taniguchi, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).