C. Detcheverry

SEU critical charge and sensitive area in a submicron CMOS technology

C. Detcheverry, C. Dachs, E. Lorfèvre, 1997 .

Bias stress in organic thin-film transistors and logic gates

Eugenio Cantatore, Dago M. de Leeuw, Stephan J. Zilker, 2001 .

RF-performance of thick damascene Cu interconnect on silicon

R. Havens, C. Detcheverry, W. van Noort, 2004, 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).

New low-cost thermally stable process to reduce silicon substrate: a way to extreme frequencies for high volume Si technologies

R. Havens, C. Detcheverry, W. van Noort, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

On-chip mm-Wave passives

R. Pijper, C. Detcheverry, W.D. van Noort, 2007, 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

Q enhancement with cross-connected coplanar waveguides in thick dual damascene Cu

R. Havens, C. Detcheverry, L. Tiemeijer, 2005, IEEE MTT-S International Microwave Symposium Digest, 2005..

1/f noise in pentacene and poly-thienylene vinylene thin film transistors

L.K.J. Vandamme, C. Detcheverry, R. Feyaerts, 2002 .

Dopant density determination in disordered organic field-effect transistors

T. M. Klapwijk, E. van Veenendaal, Dago M. de Leeuw, 2003 .

Failure mode of different irradiated power IGBT structures

J. Gasiot, J.-M. Palau, M.-C. Calvet, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).