S. Pravossoudovitch

发表

Design of routing-constrained low power scan chains

Arnaud Virazel, Patrick Girard, Y. Bonhomme, 2004 .

Delay fault propagation in synchronous sequential circuits

Patrick Girard, C. Landrault, S. Pravossoudovitch, 1994 .

Fast Bridging Fault Diagnosis using Logic Information

A. Bosio, P. Girard, A. Virazel, 2007, 16th Asian Test Symposium (ATS 2007).

Effectiveness of a variable sampling time strategy for delay fault diagnosis

C. Landrault, S. Pravossoudovitch, P. Girard, 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.

Hazards effect on stuck-open fault testability

C. Landrault, S. Pravossoudovitch, 1989, [1989] Proceedings of the 1st European Test Conference.

Delay fault propagation in synchronous sequential circuits

Patrick Girard, C. Landrault, S. Pravossoudovitch, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).

A reconvergent fanout analysis for the CPT algorithm used in delay-fault diagnosis

C. Landrault, S. Pravossoudovitch, P. Girard, 1993, Proceedings ETC 93 Third European Test Conference.

PRINT methodology: a compilation approach for cell library generation

G. Cathebras, D. Deschacht, D. Auvergne, 1988, 1988., IEEE International Symposium on Circuits and Systems.

Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior

P. Girard, A. Virazel, C. Landrault, 2007, 16th Asian Test Symposium (ATS 2007).

Minimizing peak power consumption during scan testing: test pattern modification with X filling heuristics

P. Girard, A. Virazel, C. Landrault, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..

Power-Aware Test Data Compression for Embedded IP Cores

P. Girard, A. Virazel, C. Landrault, 2006, 2006 15th Asian Test Symposium.

A concurrent approach for testing address decoder faults in eFlash memories

C. Landrault, S. Pravossoudovitch, P. Girard, 2007, 2007 IEEE International Test Conference.

SYLAM: a symbolic layout system for IC masks

C. Landrault, S. Pravossoudovitch, N. Giambiasi, 1982 .

Embedded flash testing: overview and perspectives

P. Girard, A. Virazel, C. Landrault, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..