S. W. Kim

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry.

S. W. Kim, G. Kim, G. Kim, 1999, Applied optics.

Numerical correction of reference phases in phase-shifting interferometry by iterative least-squares fitting.

S. W. Kim, G. Han, 1994, Applied optics.

Low angle forward reflected neutral beam source and its applications

S. W. Kim, B. Park, G. Yeom, 2008 .