K. Wu
发表
Y. King,
C. Lin,
Chia-En Huang,
2008,
IEEE Electron Device Letters.
J. Shih,
K. Wu,
J.F. Chen,
2009,
IEEE Transactions on Device and Materials Reliability.
J. Shih,
K. Wu,
D. J. Wu,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
R. F. Tsui,
H. W. Chin,
J. Shih,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
J.R. Shih,
J. Wang,
Chin-Hsin Tang,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Y. Huang,
K. Wu,
Y. Lee,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
C. Chiu,
J. Shih,
K. Wu,
2010,
2010 International Electron Devices Meeting.
J. H. Lee,
S. C. Chen,
J. Shih,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
J. Shih,
K. Wu,
Ya-chin King,
2004,
IEEE Transactions on Device and Materials Reliability.
K. Wu,
Y. Lee,
G. Sery,
1998,
1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100).
S. C. Chen,
C. L. Chen,
J. Shih,
2014,
2014 IEEE International Reliability Physics Symposium.
K. Wu,
P.J. Liao,
Y.S. Tsai,
2008,
2008 IEEE International Reliability Physics Symposium.
K. Wu,
S. Chang,
C. Chen,
2008,
2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. Wu,
Y.-H Lee,
W. Wang,
2014,
2014 IEEE International Reliability Physics Symposium.
K. Wu,
Y.-H Lee,
S. E. Liu,
2014,
2014 IEEE International Reliability Physics Symposium.
Noah Sturcken,
Kenneth Shepard,
Michael S. Lekas,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
W. Wang,
Y.C. Huang,
T.Y. Yew,
2011,
2011 International Reliability Physics Symposium.
R. Ranjan,
J.R. Shih,
Y.S. Tsai,
2010,
2010 IEEE International Reliability Physics Symposium.
K. Wu,
Y.-H Lee,
J. R. Shih,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.