M. Wada

10 K-gate GaAs JFET sea of gates

H. Kawasaki, M. Wada, Y. Hida, 1991 .

Stress induced leakage current limiting to scale down EEPROM tunnel oxide thickness

M. Wada, K. Naruke, S. Taguchi, 1988, Technical Digest., International Electron Devices Meeting.

A 5 V-only 0.6 mu m flash EEPROM with row decoder scheme in triple-well structure

S. Yamada, Sumio Tanaka, Akira Umezawa, 1992, 1992 IEEE International Solid-State Circuits Conference Digest of Technical Papers.

Limiting factors for programming EPROM of reduced dimensions

M. Wada, H. Nihira, S. Mimura, 1980, 1980 International Electron Devices Meeting.