H. Sayama

Novel locally strained channel technique for high performance 55nm CMOS

T. Eimori, Y. Inoue, K. Ota, 2002, Digest. International Electron Devices Meeting,.

Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes

T. Kishimoto, S. Satoh, Yoshikazu Ohno, 1996 .

oft Error Susceptibility and Immune Struc in Dynamic andom Access 's) Investigated by Nucle

K. Sonoda, H. Miyoshi, H. Sayama, 1996 .

Charge Collection Control Using Retrograde Well Tested by Proton Microprobe Irradiation

K. Sonoda, H. Sayama, S. Satoh, 1993 .

Elevated source/drain engineering with smooth surface morphology for ultrathin-SOI CMOS

T. Eimori, S. Maeda, S. Maegawa, 2002, Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT..

Soft error immunity in a DRAM investigated by nuclear microprobes

H. Sayama, S. Satoh, M. Takai, 1993 .

Precise Control of Nitrogen Profiles and Nitrogen Bond States for Highly Reliable N 2 O ‐ Grown Oxynitride

H. Sayama, A. Teramoto, H. Tamura, 2000 .

Effect of <100> channel direction for high performance SCE immune pMOSFET with less than 0.15 /spl mu/m gate length

S. Shimizu, M. Inuishi, K. Sonoda, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

Soft error susceptibility mapping of DRAMs using a high-energy nuclear microprobe

H. Sayama, S. Satoh, M. Takai, 1993 .