D. Gudmundsson

发表

A reticle quality management strategy in wafer fabs addressing progressive mask defect growth problem at low-k1 lithography

Kaustuve Bhattacharyya, Kong Son, Ben Eynon, 2004, SPIE Photomask Technology.

Comprehensive cost-effective photo defect monitoring strategy

D. Gudmundsson, R. K. Nurani, I. Peterson, 2001, 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).

Optimized sample planning for wafer defect inspection

D. Gudmundsson, J. G. Shanthikumar, R. Williams, 1999, 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314).

Optimizing robotic part feeder throughput with queueing theory

Ken Goldberg, D. Gudmundsson, Ken Goldberg, 2007 .

Challenging the paradigm of monitor reduction to achieve lower product costs

Sridhar Seshadri, D. Gudmundsson, R. K. Nurani, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

Cost effective reticle quality management strategies in wafer fabs

D. Gudmundsson, R. K. Nurani, J. G. Shanthikumar, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

Integrated process and inspection/metrology capacity planning

D. Gudmundsson, J.G. Shanthikumar, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..

Fabless-foundry partnership: models and analysis of coordination issues

Sridhar Seshadri, D. Gudmundsson, R. K. Nurani, 1999 .

Tuning robotic part feeder parameters to maximize throughput

Ken Goldberg, D. Gudmundsson, 1999 .

Critical dimension sample planning for sub-0.25 micron processes

Richard C. Elliott, D. Gudmundsson, R. K. Nurani, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning

D. Gudmundsson, J.G. Shanthikumar, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..