Hans-Oliver Joachim

Memory cell signal window test method and apparatus

Norbert Rehm, Hans-Oliver Joachim, Michael Jacob, 2004 .

Redundancy for chain-store architectures

Norbert Rehm, Hans-Oliver Joachim, Thomas Roehr, 2003 .

Simulation and two-dimensional analytical modeling of subthreshold slope in ultrathin-film SOI MOSFETs down to 0.1 mu m gate length

Hans-Oliver Joachim, Y. Inoue, Y. Yamaguchi, 1993 .