N. Tega
发表
D. Frank,
W. Haensch,
M. Rooks,
2006,
2009 Symposium on VLSI Technology.
M. Yamaoka,
N. Tega,
H. Miki,
2008,
2008 IEEE International Reliability Physics Symposium.
D. Frank,
W. Haensch,
M. Guillorn,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
D. Frank,
W. Haensch,
M. Guillorn,
2011,
2011 International Reliability Physics Symposium.
A. Kotabe,
N. Tega,
H. Miki,
2006,
2006 International Electron Devices Meeting.
D. Frank,
W. Haensch,
M. Guillorn,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
A. Kotabe,
T. Osabe,
H. Kurata,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
N. Tega,
Y. Mori,
T. Ishigaki,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
D. Hisamoto,
N. Tega,
A. Shima,
2016,
IEEE Transactions on Electron Devices.
N. Tega,
Shintaro Sato,
A. Shima,
2019,
IEEE Electron Device Letters.
D. Hisamoto,
N. Tega,
H. Miki,
2019,
Materials Science Forum.
Yu Zhu,
Michael A. Guillorn,
Wilfried Haensch,
2010,
2010 International Electron Devices Meeting.
D. Hisamoto,
N. Tega,
T. Takahama,
2013
.
D. Hisamoto,
N. Tega,
H. Yoshimoto,
2015,
IEEE Electron Device Letters.
Y. Mori,
D. Hisamoto,
Y. Shimamoto,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
T. Masuda,
N. Tega,
Y. Mori,
2018,
2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe).
M. Kobayashi,
M. Yamaoka,
E. Leobandung,
2012,
2012 International Electron Devices Meeting.
N. Tega,
Y. Mori,
A. Shima,
2015
.
T. Masuda,
N. Tega,
H. Miki,
2017
.
D. Hisamoto,
N. Tega,
Y. Mori,
2015,
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
N. Tega,
A. Shima,
K. Tani,
2020,
2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
N. Tega,
T. Mine,
A. Shima,
2015
.