K. Torii

发表

D. Frank, W. Haensch, M. Rooks, 2006, 2009 Symposium on VLSI Technology.

M. Yamaoka, N. Tega, H. Miki, 2008, 2008 IEEE International Reliability Physics Symposium.

Y. Sasago, T. Mine, S. Hanzawa, 2006, 2009 Symposium on VLSI Technology.

T. Chikyow, K. Shiraishi, K. Yamabe, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

D. Frank, W. Haensch, M. Guillorn, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

D. Frank, W. Haensch, M. Guillorn, 2011, 2011 International Reliability Physics Symposium.

D. Frank, W. Haensch, M. Guillorn, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

H. Ozaki, T. Kawamura, T. Yamazoe, 2012, IEEE Transactions on Electron Devices.

Nobuyuki Sugii, Digh Hisamoto, Kazuyoshi Torii, 2006 .

K. Torii, A. Hiraiwa, T. Mine, 2007, IEEE Transactions on Electron Devices.

M. Caymax, K. Torii, M. Hiratani, 2002, 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).

K. Torii, Eiji Takeda Eiji Takeda, Toru Kaga Toru Kaga, 1992 .

D. Hisamoto, K. Torii, N. Sugii, 2006 .

K. Torii, J. Noguchi, K. Hinode, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

K. Torii, S. Kondo, Y. Homma, 2000, Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407).

E. Murakami, T. Oshima, K. Hinode, 2002, Digest. International Electron Devices Meeting,.

T. Chikyow, S. Kamiyama, K. Shiraishi, 2007 .

T. Nabatame, K. Torii, S. Kimura, 2003 .

Yasuhiro Shimamoto, Hiroshi Miki, Toshihide Nabatame, 2003 .

T. Kawamura, T. Mine, S. Saito, 2008, 2008 IEEE International Electron Devices Meeting.

K. Torii, K. Kushida, F. Yano, 1995, 1995 Symposium on VLSI Technology. Digest of Technical Papers.

T. Chikyow, K. Shiraishi, H. Watanabe, 2006, 2006 International Workshop on Nano CMOS.

Yu Zhu, Michael A. Guillorn, Wilfried Haensch, 2010, 2010 International Electron Devices Meeting.

S. Saito, K. Torii, M. Hiratani, 2002, IEEE Electron Device Letters.

Digh Hisamoto, Kazuyoshi Torii, Toshiyuki Mine, 2008, 2008 IEEE International Reliability Physics Symposium.

T. Chikyow, N. Umezawa, K. Shiraishi, 2006 .

Kazuyoshi Torii, Keiji Takata, K. Torii, 1995 .

T. Chikyow, N. Umezawa, K. Shiraishi, 2007, IEEE Electron Device Letters.

T. Chikyow, N. Umezawa, K. Shiraishi, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

M. Kobayashi, M. Yamaoka, E. Leobandung, 2012, 2012 International Electron Devices Meeting.

K. Torii, R. Mitsuhashi, H. Kitajima, 2006, IEEE Transactions on Electron Devices.

K. Torii, M. Hiratani, S. Saito, 2001, Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537).

A. Uedono, K. Yamabe, K. Yamada, 2003, Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765).

Y. Akasaka, Y. Nara, K. Torii, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..

K. Torii, H. Ito, R. Mitsuhashi, 2003, Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765).

Y. Nara, K. Torii, S. Inumiya, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Y. Akasaka, T. Arikado, K. Torii, 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..

A. Uedono, T. Chikyow, K. Shiraishi, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Y. Kawamoto, H. Miki, K. Torii, 1995, Proceedings of International Electron Devices Meeting.