P. Roussel
发表
N. Horiguchi,
L. Ragnarsson,
T. Grasser,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
B. Kaczer,
F. Catthoor,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
B. Kaczer,
A. Asenov,
2012,
IEEE Electron Device Letters.
O. Richard,
H. Bender,
N. Collaert,
2008,
2008 Symposium on VLSI Technology.
O. Richard,
H. Bender,
N. Collaert,
2008,
2008 IEEE International SOI Conference.
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
S. Demuynck,
G. Groeseneken,
K. Croes,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
L. Ragnarsson,
T. Grasser,
2010,
2010 IEEE International Reliability Physics Symposium.
A. Hikavyy,
G. Mannaert,
T. Schram,
2011,
2011 International Electron Devices Meeting.
S. Chew,
T. Schram,
K. Devriendt,
2014
.
N. Horiguchi,
T. Grasser,
B. Kaczer,
2011,
2011 International Reliability Physics Symposium.
T. Grasser,
B. Kaczer,
M. Aoulaiche,
2009,
2009 IEEE International Reliability Physics Symposium.
L. Goux,
R. Degraeve,
D. Wouters,
2010,
2010 International Electron Devices Meeting.
L. Goux,
G. Kar,
R. Degraeve,
2012,
2012 Symposium on VLSI Technology (VLSIT).
K. Maex,
P. Roussel,
A. Witvrouw,
1994
.
K. Maex,
P. Roussel,
A. Witvrouw,
1999
.
T. Grasser,
B. O’Sullivan,
B. Kaczer,
2008,
2008 IEEE International Reliability Physics Symposium.
R. Degraeve,
T. Grasser,
B. Kaczer,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
B. Kaczer,
G. Groeseneken,
2011
.
T. Grasser,
B. Kaczer,
G. Groeseneken,
2011
.
A. Veloso,
T. Grasser,
B. Kaczer,
2011
.
T. Grasser,
M. Waltl,
B. Kaczer,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects
N. Horiguchi,
T. Grasser,
G. Rzepa,
2016,
International Integrated Reliability Workshop.
G. Beyer,
M. Stucchi,
P. Roussel,
2013
.
G. Beyer,
M. Stucchi,
P. Roussel,
2011,
2011 IEEE International Interconnect Technology Conference.
R. Degraeve,
B. Kaczer,
J. Van Houdt,
2011,
2011 International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
P. Weckx,
2012,
2012 International Electron Devices Meeting.
R. Degraeve,
J. Van Houdt,
G. Van den bosch,
2013,
2013 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
J. Van Houdt,
2013,
2013 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
D. Linten,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
L. Goux,
G. Kar,
R. Degraeve,
2018,
IEEE Electron Device Letters.
Philippe Roussel,
Tibor Grasser,
Guido Groeseneken,
2013
.
Guido Groeseneken,
Dirk Wouters,
Robin Degraeve,
2013
.
R. Degraeve,
G. Groeseneken,
P. Roussel,
2007
.
L. Goux,
G. Kar,
R. Degraeve,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Aaron Thean,
Guido Groeseneken,
Ben Kaczer,
2013
.
B. Kaczer,
T. Grasser,
L. Witters,
2013,
IEEE Transactions on Electron Devices.
S. Chew,
T. Schram,
A. Veloso,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
A. Paccagnella,
E. Simoen,
2009,
IEEE Transactions on Nuclear Science.
A. Hikavyy,
N. Horiguchi,
L. Ragnarsson,
2011,
2011 International Electron Devices Meeting.
H. Mertens,
T. Grasser,
B. Kaczer,
2013,
2013 IEEE International Electron Devices Meeting.
A. Chasin,
N. Horiguchi,
A. Thean,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Francky Catthoor,
Guido Groeseneken,
Jacopo Franco,
2014,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2012,
IEEE Transactions on Electron Devices.
N. Collaert,
D. Linten,
R. Rooyackers,
2017,
IEEE Transactions on Device and Materials Reliability.
N. Collaert,
D. Linten,
B. Kaczer,
2021,
IEEE Transactions on Electron Devices.
B. Kaczer,
J. Mitard,
G. Groeseneken,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Jerome Mitard,
Liesbeth Witters,
Tibor Grasser,
2013,
IEEE Transactions on Device and Materials Reliability.
T. Grasser,
B. Kaczer,
G. Groeseneken,
2013,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
T. Grasser,
2010,
2010 International Electron Devices Meeting.
Moonju Cho,
B Kaczer,
J Franco,
2010,
2010 IEEE International Reliability Physics Symposium.
Jerome Mitard,
Liesbeth Witters,
Tibor Grasser,
2011
.
H. Mertens,
A. Thean,
N. Collaert,
2014,
2014 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2011,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2001
.
Philippe Roussel,
Guido Groeseneken,
B. Kaczer,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
S. Demuynck,
G. Groeseneken,
M. Stucchi,
2011,
IEEE Transactions on Device and Materials Reliability.
R. Degraeve,
B. O’Sullivan,
G. Groeseneken,
2007
.
D. Linten,
A. Spessot,
B. Kaczer,
2020,
Micromachines.
D. Linten,
A. Spessot,
B. Kaczer,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
W. Sansen,
L. Pantisano,
G. Groeseneken,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
B. O’Sullivan,
G. Groeseneken,
M. Toledano-Luque,
2007,
IEEE Transactions on Electron Devices.
E. Beyne,
S. Van Huylenbroeck,
K. Croes,
2017,
IEEE Transactions on Device and Materials Reliability.
Paul Zuber,
Dimitri Linten,
Eddy Simoen,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
B. Kaczer,
M. Aoulaiche,
G. Groeseneken,
2009
.
T. Grasser,
B. Kaczer,
G. Eneman,
2013
.
R. Degraeve,
L. Ragnarsson,
T. Grasser,
2010
.
A. Paccagnella,
P. Roussel,
K. Cheung,
2002,
IEEE Electron Device Letters.
K. Maex,
P. Roussel,
A. Witvrouw,
1995
.
Christopher J. Wilson,
K. Croes,
P. Roussel,
2020,
IEEE Transactions on Electron Devices.
Christopher J. Wilson,
D. Mocuta,
K. Croes,
2019,
IEEE Transactions on Electron Devices.
G. Beyer,
K. Maex,
Y. Travaly,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Diederik Verkest,
Christopher J. Wilson,
Aaron Thean,
2016,
IEEE Transactions on Electron Devices.
V. Simons,
K. Croes,
O. Pedreira,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
P. Roussel,
J. van Houdt,
2018,
IEEE Electron Device Letters.
G. Pourtois,
L. Ragnarsson,
M. Heyns,
2009
.
K. Croes,
P. Roussel,
Z. Tokei,
2015
.
A. Thean,
N. Collaert,
G. Eneman,
2016
.
K. Maex,
P. Roussel,
A. Witvrouw,
1993
.
G. Kar,
R. Degraeve,
J. Swerts,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
T. Grasser,
B. Kaczer,
J. Franco,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
H. Bender,
K. Maex,
P. Roussel,
1995
.
H. Bender,
K. Maex,
M. Caymax,
1995
.
A. Subirats,
Dimitri Linten,
Geert Hellings,
2018,
Microelectron. Reliab..
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2018,
Microelectron. Reliab..
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2010,
2010 International Electron Devices Meeting.
R. Degraeve,
L. Goux,
B. Govoreanu,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Tibor Grasser,
Guido Groeseneken,
Jacopo Franco,
2011
.
Christopher J. Wilson,
Kris Croes,
Alicja Lesniewska,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Philippe Roussel,
Jan Vanhellemont,
P. Roussel,
1992
.
H. Maes,
P. Roussel,
J. Vanhellemont,
1991
.
M. Heyns,
P. Roussel,
J. van Houdt,
2019,
Scientific Reports.
Christopher J. Wilson,
Philippe Roussel,
Christoph Adelmann,
2016,
ACS applied materials & interfaces.
R. Degraeve,
B. Kaczer,
J. V. Houdt,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Paul Zuber,
Petr Dobrovolný,
Miguel Corbalan,
2009,
2009 10th International Symposium on Quality Electronic Design.
Francky Catthoor,
Philippe Roussel,
Miguel Corbalan,
2006,
Proceedings of the 4th International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS '06).
N. Horiguchi,
L. Ragnarsson,
B. Parvais,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability
Philippe Roussel,
Guido Groeseneken,
Ben Kaczer,
2007,
Microelectron. Reliab..
Aaron Thean,
Philippe Roussel,
Guido Groeseneken,
2015,
2015 IEEE International Reliability Physics Symposium.
Eddy Simoen,
Philippe Roussel,
Guido Groeseneken,
2010
.
S. Demuynck,
H. Bender,
G. Groeseneken,
2010,
2010 IEEE International Reliability Physics Symposium.
Philippe Roussel,
Ronak Singhal,
Joseph Hawkins,
2004
.
Paul Zuber,
Philippe Roussel,
Petr Dobrovolný,
2011,
2011 Design, Automation & Test in Europe.
R. Degraeve,
L. Goux,
B. Govoreanu,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
M. Stucchi,
I. Ciofi,
J. Versluijs,
2009,
2009 IEEE International Interconnect Technology Conference.
Philippe Roussel,
Guido Groeseneken,
Robin Degraeve,
2002
.
Dimitri Linten,
Geert Hellings,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
B. Kaczer,
J. Franco,
2023,
IEEE International Reliability Physics Symposium.
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Dimitri Linten,
Philippe Roussel,
Tibor Grasser,
2016
.
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
Guido Groeseneken,
Robin Degraeve,
Philippe Roussel,
2011,
2011 International Reliability Physics Symposium.
R. Degraeve,
P. Roussel,
I. Wolf,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2005
.
R. Degraeve,
B. Kaczer,
A. Akheyar,
2009,
2009 IEEE International Reliability Physics Symposium.
G. Beyer,
E. Beyne,
K. Croes,
2016
.
Ben Kaczer,
Georges Gielen,
Bertrand Parvais,
2019,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Dimitri Linten,
Geert Hellings,
Philippe Roussel,
2019,
IEEE Electron Device Letters.
Christopher J. Wilson,
Weimin Gao,
Ivan Ciofi,
2017,
IEEE Transactions on Electron Devices.
E. Simoen,
E. Vecchio,
H. Bender,
2013,
2013 Symposium on VLSI Technology.
G. Groeseneken,
R. Degraeve,
D. Linten,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Philippe Roussel,
Karen Maex,
J. Michelon,
2004
.
Jerome Mitard,
Anabela Veloso,
Guido Groeseneken,
2009
.
H. Zahedmanesh,
P. Roussel,
I. Ciofi,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Philippe Roussel,
Guido Groeseneken,
2013,
IEEE Transactions on Electron Devices.
D. Linten,
B. Kaczer,
G. Groeseneken,
2021,
IEEE Transactions on Electron Devices.
A. Chasin,
B. O’Sullivan,
B. Kaczer,
2022,
IEEE International Reliability Physics Symposium.
A. Asenov,
B. Kaczer,
T. Grasser,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Philippe Roussel,
Tibor Grasser,
Guido Groeseneken,
2012,
Microelectron. Reliab..
R. Degraeve,
G. Groeseneken,
P. Roussel,
2010
.
B. Kaczer,
D. Vasileska,
R. Ritzenthaler,
2014,
2014 IEEE International Reliability Physics Symposium.
A. Thean,
N. Collaert,
A. Veloso,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
G. Groeseneken,
E. Simoen,
C. Claeys,
2012,
2012 IEEE International SOI Conference (SOI).
Dimitri Linten,
Philippe Roussel,
S. Rao,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
Y. Barbarin,
Ph Roussel,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Philippe Roussel,
Ben Kaczer,
2015,
2015 IEEE International Reliability Physics Symposium.