I. Lauer
发表
David Blaauw,
Dennis Sylvester,
Daeyeon Kim,
2009,
ISLPED.
T. Adam,
L. Black,
R. Pal,
2008,
2008 Symposium on VLSI Technology.
J. Cai,
D. Frank,
R. Muralidhar,
2016,
IEEE Transactions on Electron Devices.
Effect of Uniaxial Strain on the Drain Current of a Heterojunction Tunneling Field-Effect Transistor
S. Koester,
M. Luisier,
P. Solomon,
2011,
IEEE Electron Device Letters.
T. O’Regan,
I. Lauer,
A. Majumdar,
2010
.
I. Lauer,
R. Hull,
J. Li,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
I. Lauer,
R. L. Bruce,
K. Balakrishnan,
2013,
2013 IEEE International Electron Devices Meeting.
J. Sturm,
S. Koester,
I. Lauer,
2009,
2009 Device Research Conference.
P. Oldiges,
T. B. Hook,
T. Yamashita,
2012,
2012 Symposium on VLSI Technology (VLSIT).
R. Dennard,
T. Hook,
R. Muralidhar,
2018,
IEEE Journal of the Electron Devices Society.
Anna W. Topol,
K. Ohuchi,
V. Narayanan,
2008,
Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08).
Jin Cai,
P. Oldiges,
I. Lauer,
2013,
IEEE Transactions on Electron Devices.
Dimitri A. Antoniadis,
Thomas A. Langdo,
Isaac Lauer,
2004
.
Isaac Lauer,
I. Lauer,
2001
.
David Blaauw,
Dennis Sylvester,
Daeyeon Kim,
2013,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Phil Oldiges,
Terence Hook,
Myung-Hee Na,
2015,
2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
Paul M. Solomon,
Wilfried Haensch,
Leland Chang,
2010
.
I. Lauer,
G. Braithwaite,
A. Lochtefeld,
2004,
IEEE Electron Device Letters.
N. Loubet,
T. Yamashita,
J. A. Ott,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
E. Joseph,
W. Haensch,
Y. Zhang,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).