D. Newbury

发表

Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy

K. Heinrich, D. Newbury, H. Yakowitz, 1976 .

X-Ray Spectrometry in Electron Beam Instruments

David B. Williams, Joseph I. Goldstein, Dale E. Newbury, 2012, Springer US.

High‐resolution, energy‐dispersive microcalorimeter spectrometer for X‐ray microanalysis

John M. Martinis, Kent D. Irwin, Gene C. Hilton, 1997 .

Microcalorimeter EDS with 3 eV Energy Resolution | NIST

L. L. Dulcie, G. Hilton, K. Irwin, 1998 .

Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)

Lee L Yu, D. Meier, D. Newbury, 2009, Microscopy and Microanalysis.

Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2eV energy resolution at 1.5keV

John M. Martinis, David A. Rudman, Sae Woo Nam, 2000 .

High-Resolution Microcalorimeter Energy-Dispersive Spectrometer for X-Ray Microanalysis and Particle Analysis

L. L. Dulcie, Benjamin Y. H. Liu, G. Hilton, 1998 .

Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope

D. Newbury, H. Yakowitz, 1975 .

Secondary Electron Generation by Low Energy Ion Beams

D. Joy, D. Newbury, H. Demers, 2006, Microscopy and Microanalysis.

The Development of Microcalorimeter EDS Arrays

G. Hilton, K. Irwin, L. Vale, 2002, Microscopy and Microanalysis.

Ambient-Temperature Specimen Preparation of Biological Material

P. Echlin, D. Joy, D. Newbury, 2003 .

Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers

P. Echlin, D. Joy, D. Newbury, 2003 .

Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region

D. Newbury, R. Marinenko, M. Fialin, 1996 .

Low Beam Energy SEM

D. Joy, D. Newbury, J. Goldstein, 2018 .

Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope

Dale E. Newbury, D. Newbury, 2004, Microscopy and Microanalysis.

X-Ray Spectral Measurement: WDS and EDS

P. Echlin, D. Joy, D. Newbury, 1981 .

Bulk Specimens for SEM and X-Ray Microanalysis

David B. Williams, A. D. Romig, P. Echlin, 1990 .

Thin Specimens for TEM and AEM

David B. Williams, A. D. Romig, P. Echlin, 1990 .

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

G. Hilton, K. Irwin, J. Martinis, 2000 .

Improving the Sensitivity of Electron Beam Microanalytical Techniques by Enhanced X-ray Spectrometry: X-ray Microcalorimetry, Silicon Drift Detector Energy Dispersive X-ray Spectrometry, and Polycapillary X-ray Optics

D. Newbury, 2003 .

X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope

D. Newbury, 2002, Journal of research of the National Institute of Standards and Technology.

Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy

D. Newbury, 2008 .

Improving energy stability in the National Institute of Standards and Technology Microcalorimeter X-ray detector

D. Newbury, T. Jach, J. Small, 2005, Powder Diffraction.

Microcalorimeter EDS: Benefits and Drawbacks

G. Hilton, K. Irwin, J. Martinis, 2000, Microscopy and Microanalysis.

Lowering the Limit of Detection in High Spatial Resolution Electron Beam Microanalysis With the Microcalorimeter Energy Dispersive X-Ray Spectrometer

G. Hilton, K. Irwin, J. Martinis, 1999 .

Microcalorimeter EDS Measurement of Chemical Shifts in Fe Compounds | NIST

L. L. Dulcie, J. Martinis, D. Newbury, 1998 .

Low Beam Energy X-Ray Micro Analysis: How Useful Is It?

D. Newbury, 1997, Microscopy and Microanalysis.

High Precision Multiple Kev X-Ray Analysis: Tests of Ionization Cross Sections and Monte Carlo Algorithms

D. Newbury, P. Carpenter, J. Armstrong, 1997, Microscopy and Microanalysis.

Advanced SEM imaging

D. Joy, D. Newbury, 1998 .

Low Voltage Scanning Electron Microscopy

D. Joy, D. Newbury, 2002, Microscopy Today.

Surface and bulk analysis of a deactivated raney nickel methanation catalyst

G. A. Candela, D. Newbury, R. Kelley, 1983 .

Characterization of Nanoparticles by Microbeam Analysis and Microscopy

D. Newbury, 1997 .

Trace Analysis of Nanoscale Materials by Analytical Electron Microscopy

R. Leapman, D. Newbury, 1994 .

THE ROLE OF FAST SECONDARY ELECTRONS IN DEGRADING SPATIAL RESOLUTION IN THE ANALYTICAL ELECTRON MICROSCOPE

D. Joy, D. Newbury, R. Myklebust, 1982 .

Quantitative Energy-Dispersive X-Ray Microanalysis

David B. Williams, A. D. Romig, P. Echlin, 1990 .

Particle and Rough Surface Microanalysis

David B. Williams, A. D. Romig, P. Echlin, 1990 .

The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis

D. Newbury, A. Fahey, N. Ritchie, 2010 .

High Resolution Imaging

D. Joy, D. Newbury, J. Goldstein, 2018 .

Low-Temperature Specimen Preparation

P. Echlin, D. Joy, D. Newbury, 2003 .

Practical Techniques of X-Ray Analysis

P. Echlin, D. Joy, D. Newbury, 1981 .

Solidification of Ni-Re Peritectic Alloys

W. Boettinger, D. Newbury, E. Lass, 2018, Metallurgical and Materials Transactions A.

Electron Probe Microanalysis with Cryogenic Detectors

G. Hilton, K. Irwin, J. Martinis, 2005 .

Energy Dispersive X-Ray Spectrometry

David B. Williams, A. D. Romig, P. Echlin, 1981 .

The SEM and Its Modes of Operation

P. Echlin, D. Joy, D. Newbury, 2003 .

Generation of X-Rays in the SEM Specimen

P. Echlin, D. Joy, D. Newbury, 2003 .

Electron-Beam-Specimen Interactions

David C. Joy, Patrick Echlin, Eric Lifshin, 1975 .

Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2017 .

Wheatleyite, Na 2 Cu(C 2 O 4 ) 2 .2H 2 O, a natural sodium copper salt of oxalic acid

D. Newbury, W. Simmons, D. Peacor, 1986 .

The electron microscope: the materials characterization tool of the millennium☆

David B. Williams, D. Newbury, 2000 .

Examination of Multiphase (Zr,Ti)(V,Cr,Mn,Ni)2 Ni-MH Electrode Alloys: Part I. Dendritic Solidification Structure

W. Boettinger, D. Newbury, L. Bendersky, 2010 .

Ti12.5Zr21V10Cr8.5MnxCo1.5Ni46.5−x AB2-type metal hydride alloys for electrochemical storage application: Part 1. Structural characteristics

D. Newbury, L. Bendersky, A. Creuziger, 2012 .

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, Patrick Echlin, Joseph I. Goldstein, 1986, Springer US.

The New X-ray Mapping: X-ray Spectrum Imaging above 100 kHz Output Count Rate with the Silicon Drift Detector

D. Newbury, 2006, Microscopy and Microanalysis.

Electron Probe Quantitation

K. Heinrich, D. Newbury, 1991, Springer US.

Fransoletite, a new calcium beryllium phosphate from the Tip Top Pegmatite, Custer, South Dakota

D. Newbury, D. Peacor, P. Dunn, 1983 .

Mistakes encountered during automatic peak identification of minor and trace constituents in electron-excited energy dispersive X-ray microanalysis.

D. Newbury, Dale E. Newbury, 2009, Scanning.

Exploring the limits of EDS microanalysis: rare earth element analyses

D. Newbury, H. Lowers, M. Mengason, 2018, Microscopy and Microanalysis.

The X-Ray Crystallography of Tavorite from the Tip Top Pegmatite, Custer, South Dakota

D. Newbury, J. Grice, P. Dunn, 1988, Powder Diffraction.

Characterizing Crystalline Materials in the SEM

D. Joy, D. Newbury, J. Goldstein, 2018 .

Calcium hydroxide distribution and calcium silicate hydrate composition in tricalcium silicate and β-dicalcium silicate pastes

D. Newbury, H. Taylor, H. Taylor, 1984 .

Microanalysis to nanoanalysis: measuring composition at high spatial resolution

D. Newbury, D E Newbury, 1990 .

Advances in Specimen Preparation for Biological SEM

P. Echlin, D. Joy, D. Newbury, 1986 .

X-Ray Microanalysis Case Studies

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Coating and Conductivity Techniques for SEM and Microanalysis

A. D. Romig, P. Echlin, D. Joy, 1992 .

Quantitative X-Ray Analysis: The Basics

P. Echlin, D. Joy, D. Newbury, 1992 .

Self-diffusion of silicon-30 in α-SiC single crystals

D. Newbury, R. Davis, R. Davis, 1981 .

Self-diffusion of 30Si in polycrystalline β-SiC

D. Newbury, M. Hon, R. Davis, 1980 .

Electron channeling patterns in the scanning electron microscope

David C. Joy, David L. Davidson, Dale E. Newbury, 1982 .

Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

Nicholas W M Ritchie, Dale E Newbury, D. Newbury, 2014, Journal of Materials Science.

Diffusion-induced grain boundary migration in the AuAg system☆

J. Cahn, D. Newbury, D. Turnbull, 1984 .

Color metallography of diffusion-induced grain boundary migration in Cu-Zn and Cu-As alloys☆

J. R. Manning, D. Newbury, D. B. Butrymowicz, 1983 .

Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping

D. Newbury, N. Ritchie, 2019, Microscopy and Microanalysis.

X-Ray Microanalysis in the AEM

David B. Williams, David C. Joy, A. D. Romig, 1990 .

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

David B. Williams, David B. Williams, David C. Joy, 1990, Springer US.

Electron-Specimen Interactions

A. D. Romig, P. Echlin, D. Joy, 1992 .

Digital X-ray compositional mapping with standard map corrections for wavelength dispersive spectrometer defocusing

David S. Bright, Ryna B. Marinenko, Dale E. Newbury, 1987 .

Investigating a Moche Cast Copper Artifact for Its Manufacturing Technology

D. Newbury, M. Notis, A. Shugar, 2017 .

Quantitative X-Ray Microanalysis

P. Echlin, D. Joy, D. Newbury, 1981 .

Tensile testing of strain-rate-sensative materials at constant imposed strain rate

D. Joy, D. Newbury, 1970 .

Comments on “Constant stress creep and constant true strain-rate tensile tests of the superplastic alloy PbSn”

D. Newbury, 1973 .

Diffusion-induced grain boundary migration in the Cu?Zn system?

J. Cahn, D. Newbury, D. B. Butrymowicz, 1982 .

Role of second-phase particles in the oxidation of Al-Li alloys

D. Newbury, D. Williams, J. Chabala, 1992 .

Morphological and microchemical phenomena in the high-temperature oxidation of binary Al-Li alloys

D. Newbury, D. Williams, J. Chabala, 1991 .

Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe

David B. Williams, D. Newbury, Yuh‐Lin Wang, 1989 .

Recent Advances in the Electron Microscopy of Materials

David B. Williams, D. Newbury, 1984 .

Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion

D. Joy, D. Newbury, J. Bilde-Sørensen, 1991 .

Electron Channeling Contrast in the SEM

P. Echlin, D. Joy, D. Newbury, 1986 .

Superplasticity in the ternary PbBiSn eutectic

D. Newbury, P. Hazzledine, A. Guthrie, 1972 .

Relevance of electron channeling patterns to embrittlement studies

B. W. Christ, D. Joy, D. Newbury, 1974, Metallurgical and Materials Transactions B.

Postdetonation nuclear debris for attribution

D. Newbury, R. Lindstrom, A. Fahey, 2010, Proceedings of the National Academy of Sciences.

Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?

Nicholas W M Ritchie, Dale E Newbury, D. Newbury, 2013, Scanning.

Procedures for Elimination of Charging in Nonconducting Specimens

P. Echlin, D. Joy, D. Newbury, 2003 .

Simulation of electron‐excited X‐ray spectra with NIST–NIH Desktop Spectrum Analyzer (DTSA)

D. Newbury, R. Myklebust, 2005 .

The R Factor: The X-Ray Loss Due to Electron Backscatter

D. Newbury, R. Myklebust, 1991 .

DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps

Jeffrey M. Davis, D. Newbury, N. Ritchie, 2008, Microscopy and Microanalysis.

Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD)

D. Newbury, N. Ritchie, 2013 .

Special Topics in Electron Beam X-Ray Microanalysis

P. Echlin, D. Joy, D. Newbury, 2003 .

"Standardless" quantitative electron probe microanalysis with energy-dispersive X-ray spectrometry: is it worth the risk?

C R Swyt, D. Newbury, D E Newbury, 1995, Analytical chemistry.

Secondary ion imaging of the distribution of δ′ (Al3Li) in Al-Li alloys

David B. Williams, D. Newbury, J. Chabala, 1991 .

Electron-Excited Energy Dispersive X-Ray Spectrometry at High Speed and at High Resolution: Silicon Drift Detectors and Microcalorimeters

Dale E Newbury, D. Newbury, 2006, Microscopy and Microanalysis.

Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM

L. L. Dulcie, J. Martinis, D. Newbury, 1999, Microscopy and Microanalysis.

High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-Ray Microanalysis | NIST

John M. Martinis, Kent D. Irwin, Gene C. Hilton, 1997 .

Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector

D. Newbury, N. Ritchie, A. P. Lindstrom, 2011, Microscopy and Microanalysis.

Development of national bureau of standards thin glass films for X-ray fluorescence spectrometry

D. Newbury, E. Steel, D. Blackburn, 1986 .

The Hazard of UV-Induced Oxidation to Solar-Viewing Spacecraft Optics

R. F. Berg, D. Newbury, T. Lucatorto, 2023, Solar Physics.

The Role of Standards in Secondary Ion Mass Spectrometry

D. Newbury, D. Simons, 1984 .

SiO2Al2O3 ratios of ZSM—5 crystals measured by electron microprobe and X-ray diffraction

D. Newbury, S. S. Pollack, J. Adkins, 1984 .

A new method of observing magnetic domains by scanning electron microscopy. II. Experimental confirmation of the theory of image contrast

D. Joy, D. Newbury, H. Yakowitz, 1974 .

A new method of observing magnetic domains by scanning electron microscopy I. Theory of the image contrast

D. Joy, D. Newbury, H. Yakowitz, 1973 .

SEM Microcharacterization of Semiconductors

P. Echlin, D. Joy, D. Newbury, 1986 .

Low Voltage Scanning Electron Microscopy

D. Joy, D. Newbury, 1996, Microscopy and Microanalysis.

The Visibility of Features in SEM Images

D. Joy, D. Newbury, J. Goldstein, 2018 .

Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy.

D. Newbury, D E Newbury, R D Leapman, 1993, Analytical chemistry.

Computer-aided imaging: Quantitative compositional mapping with the electron probe microanalyzer

D. Newbury, D. Bright, R. Marinenko, 1988 .

Electron Probe Microanalysis ( EPMA )

P. Echlin, D. Joy, D. Newbury, 1998 .

Backscattered Electron Imaging

David B. Williams, A. D. Romig, P. Echlin, 1990 .

Quantitative Analysis: From k-ratio to Composition

D. Joy, D. Newbury, J. Goldstein, 2018 .

Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II

D. Newbury, N. Ritchie, 2015, Microscopy and Microanalysis.

Large Area Silicon Multi-Cathode Detector Developments for Microanalysis and High Speed Elemental Mapping

J. Iwanczyk, D. Newbury, B. Patt, 2005, Microscopy and Microanalysis.

A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications

J. Iwanczyk, D. Newbury, B. Patt, 2004, Microscopy and Microanalysis.

High Speed Spectrum Imaging of Raney Nickel Alloy Using a Large Area Silicon Multi-Cathode Detector (Vortex-EM) and Event Streaming Technique

J. Iwanczyk, D. Newbury, C. Tull, 2006, Microscopy and Microanalysis.

Low Energy X-Ray Detection with a Silicon Multi-Cathode Detector for Microanalysis

J. Iwanczyk, D. Newbury, C. Tull, 2006, Microscopy and Microanalysis.

X-ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscope.

Dale E Newbury, D. Newbury, 2006, Scanning.

Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Multivariate Statistical Analysis

P. Kotula, D. Newbury, J. Michael, 2007, Microscopy and Microanalysis.

On the production of X-rays by low energy ion beams.

D. Joy, D. Newbury, H. Meyer, 2007, Scanning.

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

D. Newbury, 2002, Journal of research of the National Institute of Standards and Technology.

Secondary ion mass spectrometry

K. Heinrich, D. Newbury, Ion Microprobe Mass Analysis, 2020, Characterization of Nanoparticles.

EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector

Nicholas W M Ritchie, Jeffrey M. Davis, Dale E Newbury, 2012, Microscopy and Microanalysis.

Misidentification of Major Constituents by Automatic Qualitative Energy Dispersive X-ray Microanalysis: A Problem that Threatens the Credibility of the Analytical Community

Dale E Newbury, D. Newbury, 2005, Microscopy and Microanalysis.

Mistakes encountered during automatic peak identification in low beam energy X-ray microanalysis.

Dale E Newbury, D. Newbury, 2007, Scanning.

Development of a Spectral Database for Testing Quantitative Electron Probe Microanalysis of Rough, Bulk Samples

D. Newbury, 2000, Microscopy and Microanalysis.

Monte Carlo modelling for electron microscopy and microanalysis

D. Newbury, 1996 .

Modeling of the bremsstrahlung radiation produced in pure‐element targets by 10–40 keV electrons

D. Newbury, S. Leigh, J. Small, 1987 .

Image Formation and Interpretation

A. D. Romig, P. Echlin, D. Joy, 1992 .

Castaing’s Electron Microprobe and Its Impact on Materials Science

D. Newbury, 1999, Microscopy and Microanalysis.

Compositional Mapping with the Electron Probe Microanalyzer: Part I

D. Newbury, D. Bright, R. Marinenko, 1990 .

Strategies for background subtraction in electron probe microanalysis/x-ray compositional mapping

D. Newbury, R. Marinenko, R. Myklebust, 1989 .

Quantitative Compositional Mapping with the Electron Probe Microanalyzer

D. Newbury, D. Bright, R. Marinenko, 1991 .

Scanning electron microscope selected area channelling patterns from 1 micron specimen areas

D. Joy, D. Newbury, 1972 .

An electron microprobe study of a mature cement paste

D. Newbury, H. Taylor, 1984 .

Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials

A. D. Romig, P. Echlin, D. Joy, 1992 .

Microstructure and mineral composition of dystrophic calcification associated with the idiopathic inflammatory myopathies

A. Boyde, D. Newbury, F. Miller, 2009, Arthritis research & therapy.

Convergent Beam Electron Diffraction

David B. Williams, A. D. Romig, P. Echlin, 1990 .

Trace Element Microanalysis

David B. Williams, A. D. Romig, P. Echlin, 1990 .

Manganese-enhanced magnetic resonance microscopy of mineralization.

D. Newbury, T. Todorov, J. Small, 2007, Magnetic resonance imaging.

Monte carlo electron trajectory simulation of beam spreading dm thin foil targets

D. Newbury, R. Myklebust, 1978 .

Stereo presentation of Monte Carlo electron trajectory simulations

D. Newbury, D. Bright, R. Myklebust, 1984 .

Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry

D. Joy, D. Newbury, J. Goldstein, 2018 .

Ion Beam Microscopy

D. Joy, D. Newbury, J. Goldstein, 2018 .

Special Topics in Scanning Electron Microscopy

David C. Joy, Patrick Echlin, Eric Lifshin, 2003 .

Assessing Charging Effects on Spectral Quality for X-ray Microanalysis in Low Voltage and Variable Pressure/Environmental Scanning Electron Microscopy

D. Newbury, 2004, Microscopy and Microanalysis.

Focused Ion Beam Applications in the SEM Laboratory

D. Joy, D. Newbury, J. Goldstein, 2018 .

Electron Beam-Specimen Interactions in the Analytical Electron Microscope

D. Newbury, D. E. Newbury, 1986 .

A CATALOGUE OF ARTIFACTS OBSERVED IN ENERGY-DISPERSIVE X-RAY SPECTROMETRY AND THEIR INFLUENCE ON ANALYSIS

D. Newbury, C. Fiori, R. Myklebust, 1979 .

Quantitative X-Ray Analysis: Theory and Practice

A. D. Romig, P. Echlin, D. Joy, 1992 .

Fredrikssonite, a new member of the pinakiolite group, from Långban, Sweden

D. Newbury, W. Simmons, D. Peacor, 1983 .

Electron Beam—Specimen Interactions: Interaction Volume

D. Joy, D. Newbury, J. Goldstein, 2018 .

The “Great VPSEM Gotcha”: Great VPSEM Imaging Does Not Imply Great VPSEM X-ray Microanalysis! Degraded Spatial Resolution Is Always Imposed by Gas Scattering

D. Newbury, N. Ritchie, 2017, Microscopy and Microanalysis.

Imaging Deep Holes in Structures with Gaseous Secondary Electron Detection in the Environmental Scanning Electron Microscope

D. Newbury, 2006 .

Quantitative electron probe microanalysis of rough targets: testing the peak-to-local background method.

D. Newbury, 2006, Scanning.

Energy Dispersive Spectrometry

Dale E. Newbury, D. Newbury, 2012 .

Modeling Electron Beam Interactions in Semiconductors

D. Newbury, 1989 .

Microcalorimeter energy‐dispersive spectrometry using a low voltage scanning electron microscope

G. Hilton, K. Irwin, J. Martinis, 2000, Journal of microscopy.

Revisiting the zinc composition limit of cementation brass

D. Newbury, M. Notis, B. Newbury, 2005 .

Instrumental Effects on Quantitative Analysis by Secondary Ion Mass Spectrometry

D. Newbury, 1979 .

What is causing failures of aluminum wire connections in residential circuits

D. Newbury, 1982 .

Observations on the Mechanisms of High Resistance Junction Formation in Aluminum Wire Connections.

D. Newbury, S. Greenwald, 1980, Journal of research of the National Bureau of Standards.

Scanning Electron Microscope (SEM) Instrumentation

D. Joy, D. Newbury, J. Goldstein, 2018 .

Visualizing Low Contrast Compositional Microstructures with SDD-EDS X-ray Spectrum Imaging in the Scanning Electron Microscope

D. Newbury, 2010 .

Image Formation in the Scanning Electron Microscope

D. Newbury, 1975 .

Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?

D. Newbury, N. Ritchie, 2013, Scanning.

Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?

D. Newbury, N. Ritchie, 2011, Scanning.

Monte Carlo calculations of magnetic contrast from cubic materials in the scanning electron microscope

D. Newbury, H. Yakowitz, R. Myklebust, 1973 .

Contrast Mechanisms of Special Interest in Materials Science

D. Newbury, H. Yakowitz, 1975 .

Proposal: Let's Develop a Community Consensus K-ratio Database

Anette von der Handt, Nicholas Ritchie, Dale Newbury, 2020, Microscopy and Microanalysis.

Methods for quantitative analysis in secondary ion mass spectrometry

D. Newbury, 1980 .

How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice!

D. Newbury, N. Ritchie, 2012, Microscopy and Microanalysis.

Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes

D. Newbury, D. Bright, D E Newbury, 2004, Journal of microscopy.

The f(χ) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters

K. Heinrich, D. Newbury, J. Small, 1991 .