B. Kaminska

发表

Neural networks for the set covering problem: an application to the test vector compaction

M. Aourid, B. Kaminska, 1994, Proceedings of 1994 IEEE International Conference on Neural Networks (ICNN'94).

CYCLOGEN: automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation

B. Kaminska, A. Bechir, 1995 .

Integrated analog switch matrix with large input signal and 46 dB isolation at 1 GHz

B. Kaminska, E. Sokolowska, N. Belabbes, 1997, Proceedings of 1997 IEEE International Symposium on Circuits and Systems. Circuits and Systems in the Information Age ISCAS '97.

An optimized CMOS compatible photoreceiver

B. Kaminska, Y. Savaria, A. Gadiri, 1995, Proceedings 1995 Canadian Conference on Electrical and Computer Engineering.

Bidirectional analog 8/spl times/8 switch matrix with large input signal and over 1 GHz bandwidth

B. Kaminska, G. Fortin, E. Sokolowska, 1997, GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997.

Integrated analog switch matrix with large input signal and 46dB isolation at 1GHz

B. Kaminska, E. Sokolowska, B. Kaminska, 1996, Proceedings of the International IFIP-IEEE Conference on Broadband Communications, Global Infrastructure for the Information Age.

Generator CYCLOGEN: Automatic, Functional-Level Test Based on the Cyclomatic Complexity Measure and on the ROBDD Representation

B. Kaminska, A. Bechir, 1995 .

Testability of one-dimensional iterative arrays using a variable testability measure

B. Kaminska, D. Mukhedkar, M. Jamoussi, 1994 .

A Stand-Alone Adaptive Corrosion Protection System (ACPS) in Various Corrosive Environments

B. Kaminska, J. Patel, Sandeep Bhupendra Maharaj, 2019 .

Mixed signal DFT: a concise overview

B. Kaminska, Karim Arabi, 2003, ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486).

Interconnect propagation delay modeling and validation for the 16-MB CMOS SRAM chip

V. N. Rayapati, B. Kaminska, V. N. Rayapati, 1996 .

Mega bit BiCMOS SRAM chip package modelling and performance analysis

Bozena Kaminska, V. N. Rayapati, B. Kaminska, 1994, Proceedings of IEEE International Workshop on Memory Technology, Design, and Test.

RC-tree delay evaluation in hierarchical environment

B. Kaminska, F. Mheir-El-Saadi, B. Kaminska, 1990, Proceedings of the 33rd Midwest Symposium on Circuits and Systems.

Analog and Mixed-Signal Test

Bozena Kaminska, Haralampos-G. Stratigopoulos, B. Kaminska, 2016 .

Closing the gap between analog and digital testing

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Parametric fault simulation and test vector generation

B. Kaminska, B. Kaminska, K. Saab, 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537).

Oscillation-test methodology for low-cost testing of active analog filters

Karim Arabi, Bozena Kaminska, B. Kaminska, 1999, IEEE Trans. Instrum. Meas..

Design for testability of embedded integrated operational amplifiers

K. Arabi, B. Kaminska, B. Kaminska, 1998, IEEE J. Solid State Circuits.

Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

Bozena Kaminska, Karim Arabi, B. Kaminska, 1997, Proceedings International Test Conference 1997.

Testing analog and mixed-signal integrated circuits using oscillation-test method

Karim Arabi, Bozena Kaminska, B. Kaminska, 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology

Karim Arabi, Bozena Kaminska, B. Kaminska, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

Efficient and accurate testing of analog-to-digital converters using oscillation-test method

Karim Arabi, Bozena Kaminska, B. Kaminska, 1997, Proceedings European Design and Test Conference. ED & TC 97.

BIST for D/A and A/D Converters

Bozena Kaminska, Karim Arabi, Janusz Rzeszut, 1996, IEEE Des. Test Comput..

Oscillation-test strategy for analog and mixed-signal integrated circuits

B. Kaminska, K. Arabi, B. Kaminska, 1996, Proceedings of 14th VLSI Test Symposium.

Multifrequency Analysis of Faults in Analog Circuits

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1995, IEEE Des. Test Comput..

Analog circuit fault diagnosis based on sensitivity computation and functional testing

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1992, IEEE Design & Test of Computers.

Built-in temperature sensors for on-line thermal monitoring of microelectronic structures

Karim Arabi, Bozena Kaminska, B. Kaminska, 1997, Proceedings International Conference on Computer Design VLSI in Computers and Processors.

Force-observe, a new design for testability approach (CMOS VLSI circuits)

Y. Savaria, B. Kaminska, B. Kaminska, 1988, 1988., IEEE International Symposium on Circuits and Systems.

A hardware/software partitioning technique with hierarchical design space exploration

B. Kaminska, J. Rajski, H. Ondghiri, 1997, Proceedings of CICC 97 - Custom Integrated Circuits Conference.

Functional synthesis of digital systems with TASS

Bozena Kaminska, Said Amellal, B. Kaminska, 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Dynamic digital integrated circuit testing using oscillation-test method

K. Arabi, B. Kaminska, C. Dufaza, 1998 .

Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures

Karim Arabi, Bozena Kaminska, B. Kaminska, 1998, J. Electron. Test..

A perturbation based fault modeling and simulation for mixed-signal circuits

Bozena Kaminska, David Marche, Khaled Saab, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Analog and mixed-signal benchmark circuits-first release

José Luis Huertas, Bozena Kaminska, Adoración Rueda, 1997, Proceedings International Test Conference 1997.

CLP-based multifrequency test generation for analog circuits

B. Kaminska, A. Abderrahman, E. Cerny, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology

Naim Ben Hamida, B. Kaminska, Khaled Saab, 1996 .

LIMSoft: automated tool for design and test integration of analog circuits

Bozena Kaminska, David Marche, Khaled Saab, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Design for testability of integrated operational amplifiers using oscillation-test strategy

Karim Arabi, Bozena Kaminska, Stephen K. Sunter, 1996, Proceedings International Conference on Computer Design. VLSI in Computers and Processors.

Optimization-based multifrequency test generation for analog circuits

Bozena Kaminska, Eduard Cerny, Abdessatar Abderrahman, 1996, J. Electron. Test..

A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters

Karim Arabi, Bozena Kaminska, Janusz Rzeszut, 1994, IEEE/ACM International Conference on Computer-Aided Design.

An integrated approach for analog circuit testing with a minimum number of detected parameters

B. Kaminska, M. Slamani, G. Quesnel, 1994, Proceedings., International Test Conference.

Multifrequency testability analysis for analog circuits

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1994, Proceedings of IEEE VLSI Test Symposium.

Analog circuit testing based on sensitivity computation and new circuit modeling

Bozena Kaminska, Naim Ben-Hamida, B. Kaminska, 1993, Proceedings of IEEE International Test Conference - (ITC).

Analysis, estimation and reduction of simultaneous switching noise

Y. Savaria, A. Abderrahman, B. Kaminska, 1996, Canadian Journal of Electrical and Computer Engineering.

ML-Germinal: A new heuristic standard cell placement algorithm

Y. Savaria, A. Dahmani, B. Kaminska, 1993, 1993 European Conference on Design Automation with the European Event in ASIC Design.

Broad-band low-noise preamplifier design with GaAs MESFETs for optical communication systems

B. Kaminska, A.B. Bende, B. Kaminska, 1998, 1998 URSI International Symposium on Signals, Systems, and Electronics. Conference Proceedings (Cat. No.98EX167).

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface

Bozena Kaminska, Mustapha Slamani, Iboun Taimiya Sylla, 2001, J. Electron. Test..

Impedance mismatch and lumped capacitance effects in high frequency testing

I. T. Sylla, Mustapha Slamani, Bozena Kaminska, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors

Yvon Savaria, Bozena Kaminska, F. Darlay, 1995, IEEE Trans. Computers.

On using partial reset for pseudo-random testing

Yvon Savaria, Bozena Kaminska, Mohamed Soufi, 1995, Proceedings of ISCAS'95 - International Symposium on Circuits and Systems.

Automatic test point insertion for pseudo-random testing

M. Koudil, Y. Savaria, B. Kaminska, 1991, 1991., IEEE International Sympoisum on Circuits and Systems.

A pragmatic approach to the design of self-testing circuits

Yvon Savaria, Bozena Kaminska, Bruno Laguë, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

A new reconfigurable Test Vector Generator for built-in self-test applications

Bozena Kaminska, Samir Boubezari, B. Kaminska, 1996, J. Electron. Test..

A new dynamic test vector compaction for automatic test pattern generation

Bozena Kaminska, Bechir Ayari, B. Kaminska, 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

An automatic hierarchical delay analysis tool

Bozena Kaminska, Farid Mheir-El-Saadi, B. Kaminska, 1994, Journal of Computer Science and Technology.

A framework for hierarchical performance analysis

Bozena Kaminska, Farid Mheir-El-Saadi, B. Kaminska, 1991, EURO-DAC '91.

A framework for hierarchical performance analysis (of VLSI)

B. Kaminska, F.M. Saadi, B. Kaminska, 1991, Proceedings of the European Conference on Design Automation..

Frequency-based BIST for analog circuit testing

Bozena Kaminska, Marcelo Lubaszewski, Bernard Courtois, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Multiple fault analog circuit testing by sensitivity analysis

Bozena Kaminska, N. B. Hamida, Naim Ben Hamida, 1993 .