P. McNally

P. McNally, M. Islam, D. Cameron, 1996, Proceedings of 8th Mediterranean Electrotechnical Conference on Industrial Applications in Power Systems, Computer Science and Telecommunications (MELECON 96).

Ohmic contacts to n-type GaAs made with Pd/Sn and Pd/Sn/Au metallizations

P. McNally, M. Islam, M.S. Islam, 1996, Proceedings of 8th Mediterranean Electrotechnical Conference on Industrial Applications in Power Systems, Computer Science and Telecommunications (MELECON 96).

Examination of mechanical stresses in silicon substrates due to lead–tin solder bumps via micro-Raman spectroscopy and finite element modelling

Juha Riikonen, Patrick J. McNally, W. M. Chen, 2002 .

Raman Spectroscopy: Basics and Applications

P. McNally, V. Sathe, 2012 .

Three Dimensionial Surface Modelling: A Novel Analysis Technique for Non-Destructive X-Ray Diffraction Imaging of Semiconductor Die Warpage & Strain in Fully Encapsulated Integrated Circuits

A. Danilewsky, P. McNally, D. Manessis, 2012, 1204.1466.

Investigation of Mechanical Stresses in Underlying Silicon due to Lead-Tin Solder Bumps via Synchrotron X-Ray Topography and Finite Element Analysis

A. Danilewsky, P. McNally, D. Lowney, 2001 .

Remote sensing of a low pressure plasma in the radio near field

P. McNally, S. Kelly, 2017 .

Temperature dependent photoluminescence of nanocrystalline γ-CuCl hybrid films

A. L. Bradley, P. McNally, S. Daniels, 2014 .

Epitaxial lateral overgrowth of GaN on sapphire - An examination of epitaxy quality using synchrotron X-ray topography.

A. Danilewsky, P. McNally, D. Lowney, 2001 .

Synchrotron x-ray topography studies of epitaxial lateral overgrowth of GaN on sapphire

A. Danilewsky, P. McNally, D. Lowney, 1999 .

Direct Observation of Stress Relaxation Process in 4H-SiC Homoepitaxial Layers via In Situ Synchrotron X-Ray Topography

A. Danilewsky, P. McNally, M. Dudley, 2018, Materials Science Forum.

Poly(vinylpyrrolidone)-stabilized silver nanoparticles for strained-silicon surface enhanced Raman spectroscopy

P. McNally, A. Barron, E. Dillon, 2011 .

Non-melt selective enhancement of crystalline structure in molybdenum thin films using femtosecond laser pulses

G. O'Connor, P. McNally, R. K. Vijayaraghavan, 2021 .

Plasma modeling for a nonsymmetric capacitive discharge driven by a nonsinusoidal radio frequency current

P. McNally, P. Herbert, M. Dewan, 2002 .

Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge

P. McNally, H. Lipsanen, T. Tuomi, 2009 .

Evaluation of conduction mechanism and electronic parameters for Au/organic–inorganic CuCl hybrid film/ITO structures

A. Cowley, P. McNally, K. Rajani, 2011 .

Electrical studies on sputtered CuCl thin films

R. T. Rajendra Kumar, P. McNally, S. Daniels, 2008 .

Ultrathin chromium transparent metal contacts by pulsed dc magnetron sputtering

P. McNally, S. Daniels, K. Rajani, 2010 .

VA-6 Investigation of stress effects on the DC characteristics of GaAs MESFET's through the use of externally applied loads

L. Freund, T. Jackson, P. McNally, 1987, IEEE Transactions on Electron Devices.

Fabrication and characterisation of GaAs nanopillars using nanosphere lithography and metal assisted chemical etching

P. McNally, R. Vijayaraghavan, A. Cowley, 2016 .

Raman scattering studies of ultrashallow Sb implants in strained Si

P. McNally, N. Cowern, N. Bennett, 2008 .

Growth and characterisation of epitaxially ordered zinc aluminate domains on c-sapphire

P. McNally, M. Henry, E. McGlynn, 2008 .

Interaction of SF6 and O2 plasma with porous poly phenyl methyl silsesquioxane low-κ films

P. McNally, K. Rajani, A. Heise, 2015 .

Techniques: 3D imaging of crystal defects

P. McNally, 2013, Nature.

Highly enhanced UV responsive conductivity and blue emission in transparent CuBr films: implication for emitter and dosimeter applications

P. McNally, R. Vijayaraghavan, S. Daniels, 2017 .

Synchrotron X-ray topography study of defects in epitaxial GaAs on high-quality Ge

P. McNally, H. Lipsanen, H. Sipila, 2006 .

Characteristics of silicon nanocrystals for photovoltaic applications

P. McNally, D. Moore, Y. Chao, 2011 .

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

D. K. Bowen, A. Danilewsky, P. McNally, 2011 .

Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

A. Danilewsky, P. McNally, A. Cecilia, 2010 .

Comparison of induced stresses due to electroless versus sputtered copper interconnect technology

P. McNally, D. McNeill, J. Riikonen, 2004 .

Laser-powder bed fusion in-process dispersion of reinforcing ceramic nanoparticles onto powder beds via colloid nebulisation

P. McNally, Andre Mussatto, R. Groarke, 2022, Materials Chemistry and Physics.

Hybrid organic–inorganic spin-on-glass CuCl films for optoelectronic applications

A. L. Bradley, P. McNally, S. Daniels, 2009 .

Growth and Properties of SiC On-Axis Homoepitaxial Layers

A. Henry, E. Janzén, P. McNally, 2010 .

Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon

A. L. Bradley, A. Cowley, P. McNally, 2010 .

In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs

P. McNally, H. Lipsanen, A. Säynätjoki, 2008 .

Highly conductive Sb-doped layers in strained Si

A. Smith, P. McNally, N. Cowern, 2006 .

Enhanced Antimony Activation for Ultra-Shallow Junctions in Strained Silicon

A. Smith, P. McNally, N. Cowern, 2006 .

Influence of Oxygen Plasma on the Growth, Structure, Morphology, and Electro-Optical Properties of p-Type Transparent Conducting CuBr Thin Films

P. McNally, R. Vijayaraghavan, S. Daniels, 2014 .

Self-organized ZnAl2O4 nanostructures grown on c-sapphire

P. McNally, Xu Lu, M. Henry, 2007 .

Optical properties of undoped and oxygen doped CuCl films on silicon substrates

A. L. Bradley, O. F. Lucas, P. McNally, 2009 .

Optical properties of CuCl films on silicon substrates

A. L. Bradley, O. F. Lucas, P. McNally, 2008 .

Multi-Messenger Radio Frequency and Optical Diagnostics of Pulsed Laser Ablation Processes

P. McNally, Mahdieh Samimi, Hassan Hosseinlaghab, 2022, Journal of Manufacturing and Materials Processing.

Stress behaviour of reactively sputtered nitrogenated carbon films

P. McNally, J. Gilvarry, M. Monclús, 1998 .

Investigation of strain induced effects in silicon wafers due to proximity rapid thermal processing using micro-Raman spectroscopy and synchrotron x-ray topography

A. Danilewsky, P. McNally, T. Perova, 2002 .

Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon

A. Danilewsky, P. McNally, B. Tanner, 2017 .

The Effect of Sic Additives on the Cycling Performance of Caco3 When Used as a High-Temperature Thermal Battery

P. McNally, M. V. Sofianos, T. Richardson, 2022, SSRN Electronic Journal.

Three Dimensionial Surface Modelling: A Novel Analysis Technique for Non-Destructive X-Ray Diffraction Imaging of Semiconductor Die Warpage & Strain in Fully Encapsulated Integrated Circuits

A. Danilewsky, P. McNally, D. Manessis, 2012, 1204.1466.

Encapsulation of the heteroepitaxial growth of wide band gap γ-CuCl on silicon substrates

A. L. Bradley, P. McNally, D. Taylor, 2006 .

Reduction of the impact of atmospheric ageing effects on spin coated γ-CuCl nanocrystalline hybrid films

P. McNally, S. Daniels, M. M. Alam, 2016 .

Synthesis and Characterization of Copper (I) Chloride (CuCl) Nanocrystals in Conductive Polymer for UV Light Emitters

P. McNally, S. Daniels, K. Rajani, 2010 .

Towards the fabrication of a UV light source based on CuCl thin films

P. McNally, S. Daniels, A. Mitra, 2007 .

Evaluation of the chemical, electronic and optoelectronic properties of γ-CuCl thin films and their fabrication on Si substrates

A. L. Bradley, P. McNally, D. Taylor, 2007 .

Stoichiometry control of sputtered CuCl thin films: Influence on ultraviolet emission properties

P. McNally, S. Daniels, D. Cameron, 2006 .

Growth and characterisation of wide-bandgap, I-VII optoelectronic materials on silicon

O. F. Lucas, P. McNally, S. Daniels, 2005 .

Mechanism of stress relaxation and phase transformation in additively manufactured Ti-6Al-4V via in situ high temperature XRD and TEM analyses

P. McNally, V. Nicolosi, R. Vijayaraghavan, 2020, Acta Materialia.

Structural, optical and electrical properties of Co‐evaporated CuCl/KCl films

P. McNally, D. Taylor, S. Daniels, 2009 .

Assessing dependency of part properties on the printing location in laser-powder bed fusion metal additive manufacturing

P. McNally, Andre Mussatto, R. Groarke, 2022, Materials Today Communications.

Femtosecond Laser Assisted Crystallization of Gold Thin Films

G. O'Connor, P. McNally, R. Vijayaraghavan, 2021, Nanomaterials.

Electrical properties of γ-CuCl thin films

P. McNally, D. Taylor, S. Daniels, 2009 .

Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping

A. L. Bradley, P. McNally, S. Daniels, 2006 .

The use of wide-bandgap CuCl on silicon for ultra-violet photonics

L. O'Reilly, G. Natarajan, P. J. McNally, 2005, SPIE OPTO-Ireland.

Dislocation sources and slip band nucleation from indents on silicon wafers

D. K. Bowen, A. Danilewsky, P. McNally, 2010 .

Real‐time X‐ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments

Patrik Vagovič, Patrick J. McNally, Alexander Rack, 2011 .

Thermal slip sources at the extremity and bevel edge of silicon wafers

P. McNally, B. Tanner, J. Wittge, 2011 .

Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon

A. Danilewsky, P. McNally, J. Wittge, 2011 .

X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers

D. K. Bowen, A. Danilewsky, P. McNally, 2010, Powder Diffraction.

Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography

Patrick J. McNally, D. Allen, E. Gorostegui-Colinas, 2010 .

A universal method for thermal conductivity measurements on micro-/nano-films with and without substrates using micro-Raman spectroscopy

P. McNally, R. Vijayaraghavan, N. Bennett, 2017 .

Growth of n-type γ-CuCl with improved carrier concentration by pulsed DC sputtering: Structural, electronic and UV emission properties

A. L. Bradley, P. McNally, S. Daniels, 2011 .

In Situ Synchrotron X-Ray Topography Observation of Double-Ended Frank-Read Sources in PVT-Grown 4H-SiC Wafers

A. Danilewsky, P. McNally, M. Dudley, 2018, Materials Science Forum.

Observation of Misfit Dislocation Strain‐Induced Surface Features for a Si/Ge–Si Heterostructure Using Total Reflection X‐Ray Topography

A. Danilewsky, P. McNally, J. Bonar, 2000 .

The quality of 200 mm diameter epitaxial Si wafers for advanced CMOS technology monitored using synchrotron X-ray topography

A. Danilewsky, P. McNally, T. Tuomi, 1999 .

The Use of X-ray Topography to Map Mechanical, Thermomechanical and Wire-Bond Strain Fields in Packaged Integrated Circuits

A. Danilewsky, P. McNally, T. Tuomi, 1997 .

The importance of the Pd to Sn ratio and of annealing cycles on the performance of Pd/Sn ohmiccontacts to n-GaAs

P. McNally, M. Islam, D. Cameron, 1997 .

Effects of Au overlayers on the electrical and morphological characteristics of Pd/Sn ohmic contacts to n-GaAs

P. McNally, M. Islam, D. Cameron, 1996 .

Synchrotron X-ray topography of undoped VCz GaAs crystals

P. McNally, P. Rudolph, J. Riikonen, 2002 .

The use of generalised models to explain the behaviour of ohmic contacts to n-type GaAs

P. McNally, 1992 .

UV emission on a Si substrate: Optical and structural properties of γ‐CuCl on Si grown using liquid phase epitaxy techniques

A. L. Bradley, A. Cowley, A. Danilewsky, 2009 .

In-situ sensing, process monitoring and machine control in Laser Powder Bed Fusion: A review

Víctor Acinas Garzón, P. McNally, M. Obeidi, 2021 .

Synchrotron X-ray topography study of defects in indium antimonide P-I-N structures grown by metal organic vapour phase epitaxy

A. Danilewsky, P. McNally, A. Owens, 2005 .

Growth of CuCl thin films by magnetron sputtering for ultraviolet optoelectronic applications

A. L. Bradley, P. McNally, S. Daniels, 2006 .

Development of BMG-B2 nanocomposite structure in HAZ during laser surface processing of ZrCuNiAlTi bulk metallic glasses

A. Heidarzadeh, P. McNally, D. Brabazon, 2020 .

Characterization of the carrot defect in 4H-SiC epitaxial layers

A. Henry, J. Bergman, P. McNally, 2010 .

Thermal stability of the non-alloyed Pd/Sn and Pd/Ge Ohmic contacts to n-GaAs

P. McNally, M. Islam, D. Cameron, 1997 .

Comparison of pd/sn and pd/sn/au thin-film Systems for Device Metallization

P. McNally, M. Islam, D. Cameron, 1996 .

Characterization of Pd/Sn ohmic contacts on n-GaAs using electrical measurements, EDAX and SIMS

P. McNally, M.S. Islam, D. Cameron, 1995, Proceedings of the 3rd IEEE International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO 95.

Dislocations in GaAs p-i-n diodes grown by hydride vapour phase epitaxy

A. Danilewsky, P. McNally, T. Tuomi, 2008 .

Synchrotron X-ray topographic study of dislocations and stacking faults in InAs

A. Danilewsky, P. McNally, A. Owens, 2005 .

Low Temperature Growth GaAs on Ge

P. McNally, H. Lipsanen, J. Likonen, 2005 .

Influence of H2 Preconditioning on the Nucleation and Growth of Self-Assembled Germanium Islands on Silicon (001)

D. Bagnall, E. Mendoza, P. McNally, 2004 .

Comprehensive investigation of Ge–Si bonded interfaces using oxygen radical activation

P. McNally, I. Ferain, M. Morris, 2011 .

Evaluation via powder metallurgy of nano-reinforced iron powders developed for selective laser melting applications

P. McNally, Andre Mussatto, R. Groarke, 2019, Materials & Design.

In-situ XRD study on the effects of stress relaxation and phase transformation heat treatments on mechanical and microstructural behaviour of additively manufactured Ti-6Al-4V

P. McNally, F. R. Kaschel, D. Dowling, 2021, Materials Science and Engineering: A.

Simultaneous depth-profiling of electrical and elemental properties of ion-implanted arsenic in silicon by combining secondary-ion mass spectrometry with resistivity measurements.

P. McNally, N. Bennett, C. S. Wong, 2016, The Review of scientific instruments.

Temperature dependent optical properties of UV emitting γ-CuCl thin films

P. McNally, S. Daniels, A. Mitra, 2008 .

Optical investigations on sputtered CuCl thin films

P. McNally, S. Daniels, A. Mitra, 2005 .

Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates

A. Danilewsky, P. McNally, L. Kirste, 2015 .

Modeling of harmonic contributions to non-symmetrical RF plasmas

P. McNally, P. Herbert, M. Dewan, 2001 .

Determination of SF 6 reactive ion etching end point of the SiO 2 /Si system by plasma impedance monitoring

Tatiana S. Perova, Patrick J. McNally, P.A.F. Herbert, 2003 .

Determination of crystal misorientation in epitaxial lateral overgrowth of GaN

A. Danilewsky, P. McNally, J. Riikonen, 2002 .

Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs‐based power varactor diodes

J. A. Higgins, Patrick J. McNally, P.A.F. Herbert, 1996 .

Pulsed-Plasma Physical Vapor Deposition Approach Toward the Facile Synthesis of Multilayer and Monolayer Graphene for Anticoagulation Applications.

P. McNally, R. Vijayaraghavan, S. Daniels, 2016, ACS applied materials & interfaces.

X-ray asterism and the structure of cracks from indentations in silicon

A. Danilewsky, P. McNally, B. Tanner, 2016 .

Infrared photoluminescence imaging of infrared materials: HgCdTe/Cd(Zn)Te heterostructures

P. McNally, V. Babentsov, C. Corsi, 2004 .

Performances of novel Pd/Sn and Pd/Sn/Au ohmic metallizations to n-GaAs

M. Q. Huda, P. McNally, A. Alam, 2002 .

Improvement of electrical properties of ITO thin films by melt-free ultra-short laser crystallization

G. O'Connor, P. McNally, R. Vijayaraghavan, 2021, Journal of Physics D: Applied Physics.

Structural and optoelectronic properties of sputtered copper (I) chloride

Patrick J. McNally, David C. Cameron, Louise Bradley, 2005, SPIE OPTO-Ireland.

Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs

P. Hurley, P. McNally, S. Monaghan, 2014 .

Dellafossite CuAlO2 film growth and conversion to Cu–Al2O3 metal ceramic composite via control of annealing atmospheres

P. McNally, A. Cowley, E. McGlynn, 2013 .

Use of plasma impedance monitoring for the determination of SF6 reactive ion etch process end points in a SiO2/Si system

P. McNally, M. Dewan, P. Herbert, 2001 .

In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices

A. Danilewsky, P. McNally, B. Tanner, 2019, Microelectronics Reliability.

Ultrashort laser sintering of printed silver nanoparticles on thin, flexible, and porous substrates

G. O'Connor, A. Jilani, P. McNally, 2023, Journal of Physics D: Applied Physics.

Structural investigation of MOVPE-grown GaAs on Ge by x-ray techniques

P. McNally, P. Tejedor, J. Molina-Aldareguia, 2012 .

Influence of target to substrate distance on the sputtered CuCl film properties

P. McNally, S. Daniels, D. Cameron, 2008 .

Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging.

A. Danilewsky, P. McNally, T. Baumbach, 2015, Journal of synchrotron radiation.

Attitude Control of Underactuated Multibody Spacecraft

Ilya Kolmanovsky, Chunlei Rui, N. Harris McClamroch, 1996 .

Attitude Control of Underactuated Multibody Spacecraft Chunlei Rui

I. Kolmanovsky, N. McClamroch, P. McNally, 1996 .

Multi-technique characterization of MOVPE-grown GaAs on Si

Paul K. Hurley, Patrick J. McNally, Scott Monaghan, 2010 .

4H-SiC Epitaxial Layers Grown on On-Axis Si-Face Substrate

A. Henry, E. Janzén, P. McNally, 2007 .

Antimony for n-type metal oxide semiconductor ultrashallow junctions in strained Si: A superior dopant to arsenic?

A. Smith, P. McNally, N. Bennett, 2008 .

Constraints on micro-Raman strain metrology for highly doped strained Si materials

P. McNally, N. Bennett, T. Noakes, 2008 .

Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers

A. Danilewsky, P. McNally, Z. Zytkiewicz, 1999 .

Synchrotron x-ray topography analysis of GaAs layers grown on GaAs substrates by liquid phase epitaxial lateral overgrowth

P. McNally, Z. Zytkiewicz, D. Dobosz, 1999 .

B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages

Bart Vandevelde, C. S. Wong, Ingrid De Wolf, 2016, Microelectron. Reliab..

Development of B-spline X-ray Diffraction Imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips

I. De Wolf, A. Ivankovic, V. Cherman, 2014, 2014 IEEE 64th Electronic Components and Technology Conference (ECTC).

Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy

D. P. Lowney, L. Considine, Patrick J. McNally, 2005 .

A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior

A. Baric, Patrick J. McNally, P. McNally, 1998 .

Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering

P. McNally, S. Krishnamurthy, S. Daniels, 2013, Journal of physics. Condensed matter : an Institute of Physics journal.

Tilted-wing-induced stress distribution in epitaxial lateral overgrown GaN

P. McNally, J. Riikonen, D. Lowney, 2003 .

Combined use of three-dimensional X-ray diffraction imaging and micro-Raman spectroscopy for the non-destructive evaluation of plasma arc induced damage on silicon wafers

A. Danilewsky, P. McNally, M. Morshed, 2011 .

X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

D. K. Bowen, A. Danilewsky, P. McNally, 2013, Powder Diffraction.

Raman metrology for advanced CMOS devices - advantages and challenges

Steve McCoy, Patrick J. McNally, D. Bolze, 2009 .

Crack propagation and fracture in silicon wafers under thermal stress

A. Danilewsky, P. McNally, T. Baumbach, 2013, Journal of applied crystallography.

Laser machined macro and micro structures on glass for enhanced light trapping in solar cells

P. McNally, D. Brabazon, David Moore, 2013 .

A study of automobile suspension design using optimization technique

Qiang Yu, Keiichi Motoyama, Takashi Yamanaka, 2000 .

An evaluation of an automated detection algorithm to count defects present in X-Ray topographical images of SiC wafers

A. Danilewsky, P. McNally, L. Rowland, 2007 .