H. Lin

发表

T.-Y. Huang, C. Su, H. Lin, 2005, IEEE Electron Device Letters.

C. Merckling, J. Mitard, E. Simoen, 2013, 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013).

H. Lin, 1980, IEEE Transactions on Electron Devices.

H.C. Lin, H. Lin, C. Yao, 1986, IEEE Electron Device Letters.

M. Liang, C. Chang, H. Lin, 2000, 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479).

H. Lin, F. Kub, 1996, International Electron Devices Meeting. Technical Digest.

H. Lin, M. Lee, Shih-Wen Shen, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

H. Lin, A. Oates, C. Hung, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

R. G. Rosemeier, H. Lin, R. Armstrong, 1980, 1980 International Electron Devices Meeting.

H.C. Lin, H. Lin, F.H. Wang, 2007, 2007 IEEE Conference on Electron Devices and Solid-State Circuits.

H. Lin, T. Huang, H. Hsu, 2007, 2007 IEEE Conference on Electron Devices and Solid-State Circuits.

P. Ye, H. Lin, G. Wilk, 2005, 2005 International Semiconductor Device Research Symposium.

T. Chao, H. Lin, H. Lin, 2002, 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595).

N. Bluzer, H.C. Lin, H. Lin, 1978, 1978 International Electron Devices Meeting.