P. Chang

22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL

S. Narasimha, K. Onishi, J. Johnson, 2012, 2012 International Electron Devices Meeting.

Recent Results from the Stony Brook Scanning Microscope

John M. Kenney, Harvey Rarback, Janos Kirz, 1984 .

The Stony Brook/NSLS Scanning Microscope

J. Kirz, Y. Vladimirsky, I. McNulty, 1988 .

Soft X-ray microscopy at the NSLS☆

J. Kirz, D. Sayre, M. Howells, 1984 .

The micromagnetics of thin-film disk recording tracks

P. Chang, H. Tong, R. Ferrier, 1984 .

Thermostrictive recording on Permalloy films

H. J. Kump, P. T. Chang, P. Chang, 1966 .