T. Scherg

Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability

M. Treu, R. Rupp, P. Türkes, 2005 .

Studies on the butt-coupling of InGaAsP-waveguides realized with selective area metalorganic vapour phase epitaxy

T. Scherg, R. Strzoda, N. Emeis, 1995 .

Study of Ta-Si-N thin films for use as barrier layer in copper metallizations

C. Wenzel, T. Scherg, H. Schulze, 1999 .

Preparation of AlVO4-films for sensor application via a sol-gel/spin-coating technique

T. Scherg, H. Knözinger, H. Göbel, 1997 .

Reliability considerations for recent Infineon SiC diode releases

M. Holz, G. Hultsch, T. Scherg, 2007, Microelectron. Reliab..