S. Amoroso
发表
Jie Ding,
A. Asenov,
Naoto Horiguchi,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
N. Horiguchi,
B. Kaczer,
A. Asenov,
2014,
IEEE Transactions on Electron Devices.
Andrew R. Brown,
Jinfeng Kang,
R. Aitken,
2015,
IEEE Transactions on Electron Devices.
Asen Asenov,
Toufik Sadi,
Andrew R. Brown,
2015,
IEEE Circuits and Systems Magazine.
A. Asenov,
L. Donetti,
C. Riddet,
2015,
International Conference on Simulation of Semiconductor Processes and Devices.
J. M. Sellier,
S. Selberherr,
A. Asenov,
2014
.
A. Lacaita,
A. Asenov,
A. Spinelli,
2013,
IEEE Electron Device Letters.
On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects
N. Horiguchi,
T. Grasser,
G. Rzepa,
2016,
International Integrated Reliability Workshop.
Christian Monzio Compagnoni,
A. Ghetti,
A. Mauri,
2012,
IEEE Transactions on Electron Devices.
A. Asenov,
L. Gerrer,
F. Adamu-Lema,
2013,
IEEE Transactions on Electron Devices.
Christian Monzio Compagnoni,
A Maconi,
A Mauri,
2010,
IEEE Transactions on Electron Devices.
A. Asenov,
L. Gerrer,
F. Adamu-Lema,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
E. Camerlenghi,
A. Spinelli,
C. M. Compagnoni,
2011
.
A. Asenov,
C. Millar,
S. Amoroso,
2018,
IEEE Transactions on Electron Devices.
A. Mauri,
Christian Monzio Compagnoni,
A. L. Lacaita,
2011,
IEEE Transactions on Electron Devices.
A. Asenov,
Xingsheng Wang,
S. Amoroso,
2017
.
Asen Asenov,
Douglas J. Paul,
Vihar P. Georgiev,
2017,
IEEE Transactions on Nanotechnology.
A. Asenov,
C. Millar,
S. Amoroso,
2018,
IEEE Transactions on Electron Devices.
Andrea L. Lacaita,
Gabriella Ghidini,
Salvatore M. Amoroso,
2010,
2010 IEEE International Reliability Physics Symposium.
A. Asenov,
L. Donetti,
C. Riddet,
2014,
International Conference on Simulation of Semiconductor Processes and Devices.
A. Lacaita,
A. Spinelli,
S. Amoroso,
2012,
IEEE Transactions on Electron Devices.
R. Aitken,
A. Asenov,
L. Shifren,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Jie Ding,
A. Asenov,
Salvatore M. Amoroso,
2014,
Microelectronics and reliability.
A. Asenov,
C. Riddet,
S. Amoroso,
2014,
2014 International Workshop on Computational Electronics (IWCE).
S. Selberherr,
A. Asenov,
M. Nedjalkov,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
A. Asenov,
S. Amoroso,
L. Cronin,
2014
.
A. Asenov,
L. Gerrer,
S. Amoroso,
2013,
Journal of Computational Electronics.
A. Asenov,
S. Amoroso,
F. Adamu-Lema,
2015,
IEEE Transactions on Electron Devices.
A. Asenov,
C. Riddet,
Xingsheng Wang,
2014,
IEEE Transactions on Electron Devices.
Asen Asenov,
Salvatore M. Amoroso,
Louis Gerrer,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Sani R. Nassif,
Asen Asenov,
Binjie Cheng,
2015,
IEEE Transactions on Electron Devices.
A. Asenov,
L. Gerrer,
F. Adamu-Lema,
2012,
2012 15th International Workshop on Computational Electronics.
Christian Monzio Compagnoni,
Alessandro S. Spinelli,
A. Maconi,
2011
.
V. Moroz,
S. Amoroso,
P. Asenov,
2021,
IEEE Electron Device Letters.
Asen Asenov,
Andrew R. Brown,
Binjie Cheng,
2015,
IEEE Transactions on Electron Devices.