Marko Simicic
发表
Jie Ding,
A. Asenov,
Naoto Horiguchi,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Nowab Reza M. D. Ashif,
D. Linten,
Shih-Hung Chen,
2020
.
D. Linten,
Shih-Hung Chen,
Marko Simicic,
2018,
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Shih-Hung Chen,
Marko Simicic,
N. Jack,
2020,
2020 42nd Annual EOS/ESD Symposium (EOS/ESD).
D. Linten,
Shih-Hung Chen,
Marko Simicic,
2019,
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
D. Linten,
B. Parvais,
B. Kaczer,
2020
.
A. Subirats,
Dimitri Linten,
Geert Hellings,
2018,
Microelectron. Reliab..
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2018,
Microelectron. Reliab..
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Dimitri Linten,
Philippe Roussel,
Tibor Grasser,
2016
.
B. Parvais,
B. Kaczer,
D. Verkest,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Ben Kaczer,
Georges Gielen,
Bertrand Parvais,
2019,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Parvais,
G. Groeseneken,
G. Gielen,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
H. Mertens,
N. Horiguchi,
A. Veloso,
2020,
2020 42nd Annual EOS/ESD Symposium (EOS/ESD).