A. Cathignol
发表
Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET
A. Asenov,
G. Ghibaudo,
B. Cheng,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2009
.
A. Asenov,
G. Ghibaudo,
B. Cheng,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
T. Skotnicki,
A. Cathignol,
2007,
2006 European Solid-State Device Research Conference.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2006
.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
G. Ghibaudo,
A. Cathignol,
A. Bajolet,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
G. Ghibaudo,
A. Cathignol,
A. Bajolet,
2011
.
L. Vendrame,
A. Cathignol,
S. Mennillo,
2008,
2008 IEEE International Conference on Microelectronic Test Structures.
T. Skotnicki,
S. Monfray,
F. Arnaud,
2008,
IEEE Transactions on Electron Devices.
O. Faynot,
V. Arnal,
A. Vandooren,
2007,
2007 IEEE International Electron Devices Meeting.
Terence B. Hook,
Gerard Ghibaudo,
Jeffrey B. Johnson,
2011
.
A. Bajolet,
Augustin Cathignol,
Gerard Ghibaudo,
2010
.