K. Rochereau
发表
Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET
A. Asenov,
G. Ghibaudo,
B. Cheng,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2009
.
S. Parihar,
K. Rochereau,
J. Mc Ginley,
2004,
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).
A. Asenov,
G. Ghibaudo,
B. Cheng,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
T. Skotnicki,
A. Cathignol,
2007,
2006 European Solid-State Device Research Conference.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2006
.
G. Ghibaudo,
A. Cathignol,
K. Rochereau,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
B. Tavel,
M. Bidaud,
M. Denais,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
V. Huard,
K. Rochereau,
F. Martinez,
2008,
2008 9th International Conference on Ultimate Integration of Silicon.
G. Mugny,
R. Bianchi,
P. Besson,
2022,
OPTO.
Dominique Thomas,
Jean Michailos,
Krysten Rochereau,
2019,
ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC).