S. Bordez

Abnormally high local electrical fluctuations in heavily pocket-implanted bulk long MOSFET

G. Ghibaudo, A. Cathignol, K. Rochereau, 2009 .

Improved methodology for better accuracy on transistors matching characterization

G. Ghibaudo, A. Cathignol, K. Rochereau, 2006, 2006 IEEE International Conference on Microelectronic Test Structures.

Abnormally High Current Local Fluctuations in Heavily Pocket-implanted Bulk Long MOSFET

G. Ghibaudo, A. Cathignol, K. Rochereau, 2008, 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Spacing impact on MOSFET mismatch

L. Vendrame, A. Cathignol, S. Mennillo, 2008, 2008 IEEE International Conference on Microelectronic Test Structures.