R. Vollertsen
发表
E. Nowak,
E. Wu,
L. Han,
2000
.
Ernest Y. Wu,
Jordi Sune,
E. Wu,
2009,
2009 IEEE International Reliability Physics Symposium.
H. Reisinger,
C. Schlunder,
R. Vollertsen,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
H. Reisinger,
C. Schlunder,
R. Vollertsen,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.
T. Grasser,
G. Rzepa,
K. Puschkarsky,
2019,
IEEE Transactions on Electron Devices.
Jordi Suñé,
Ernest Y. Wu,
Timothy D. Sullivan,
2009
.
H. Reisinger,
C. Schlunder,
R. Vollertsen,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
W. Abadeer,
R. Vollertsen,
1996,
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.
W. Abadeer,
J. Stathis,
D. Buchanan,
1994,
52nd Annual Device Research Conference.
R. Vollertsen,
R. Hijab,
R. Vollertsen,
1999,
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460).
Rolf-Peter Vollertsen,
Rainer Duschl,
R. Vollertsen,
2005,
Microelectron. Reliab..
Voltage acceleration of oxide breakdown in the sub-10 nm Fowler-Nordheim and direct tunneling regime
R.-P. Vollertsen,
R. Duschl,
R. Vollertsen,
2005,
2005 IEEE International Integrated Reliability Workshop.
Rolf-Peter Vollertsen,
R. Vollertsen,
2003,
Microelectron. Reliab..
W. Abadeer,
S. Nadahara,
R. Vollertsen,
1995
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
Jordi Suñé,
Ernest Y. Wu,
Edward J. Nowak,
2002
.
W. Abadeer,
R. Vollertsen,
1996
.
W. W. Abadeer,
R.-P. Vollertsen,
Eduard A. Cartier,
1994,
Proceedings of 1994 VLSI Technology Symposium.
R.-P. Vollertsen,
R. Vollertsen,
1993
.
R.-P. Vollertsen,
W. G. Kleppmann,
R. Vollertsen,
1990,
Proceedings of the 1991 International Conference on Microelectronic Test Structures.
Ernest Y. Wu,
Edward J. Nowak,
A. Vayshenker,
2001
.
Rolf-Peter Vollertsen,
E. Y. Wu,
E. Wu,
2004,
Microelectron. Reliab..
R.-P. Vollertsen,
E. Y. Wu,
R. Vollertsen,
2003,
IEEE International Integrated Reliability Workshop Final Report, 2003.
G. Georgakos,
K. Kölpin,
R.-P. Vollertsen,
2015,
2015 IEEE International Reliability Physics Symposium.
Ernest Y. Wu,
E. Wu,
R. Vollertsen,
2002
.