F. Gilibert

Characterization & modeling of low electric field gate-induced-drain-leakage [MOSFET]

A. Juge, D. Rideau, A. Dray, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

Strained Si/SiGe MOSFET capacitance modeling based on band structure analysis

T. Skotnicki, F. Boeuf, E. Batail, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

Surface potential compact model for embedded flash devices oriented to IC memory design

Y. Leblebici, D. Rideau, A. Schmid, 2012, 2012 13th International Conference on Ultimate Integration on Silicon (ULIS).

Comprehensive Phase-Change Memory Compact Model for Circuit Simulation

Marina Reyboz, Marc Bocquet, Fabien Gilibert, 2018, IEEE Transactions on Electron Devices.