A. Hiraiwa

发表

H. Kawarada, A. Hiraiwa, D. Xu, 2014, 2014 IEEE International Electron Devices Meeting.

K. Torii, A. Hiraiwa, T. Mine, 2007, IEEE Transactions on Electron Devices.

Hiroshi Kawarada, Atsushi Hiraiwa, H. Kawarada, 2015 .

A. Hiraiwa, T. Kusaka, K. Mukai, 1988 .

H. Kawarada, A. Hiraiwa, H. Ishiwata, 2021, IEEE Electron Device Letters.

A. Hiraiwa, T. Itoga, 1994 .

A. Hiraiwa, D. Ishikawa, S. Sakai, 2002, Digest. International Electron Devices Meeting,.

H. Kawarada, A. Hiraiwa, S. Onoda, 2019, IEEE Electron Device Letters.

A. Hiraiwa, Y. Homma, Hidetoshi Miyazaki, 1992 .

T. Kure, A. Hiraiwa, F. Murai, 1989, IEEE Electron Device Letters.

A. Hiraiwa, J. Yugami, T. Mine, 1992, ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.

A. Hiraiwa, Takashi Kobayashi, 1991 .

H. Kawarada, Y. Yamaguchi, A. Hiraiwa, 2021, IEEE Transactions on Electron Devices.

Hiroshi Kawarada, Atsushi Hiraiwa, Nobutaka Oi, 2019, IEEE Electron Device Letters.

H. Kawarada, A. Hiraiwa, S. Kono, 2018, Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.

Hiroshi Kawarada, Atsushi Hiraiwa, Masafumi Inaba, 2017, IEEE Electron Device Letters.

Y. Ohji, A. Hiraiwa, K. Mukai, 1987, 25th International Reliability Physics Symposium.

H. Kawarada, A. Hiraiwa, Akira Daicho, 2012 .

H. Kawarada, A. Hiraiwa, J. Tsunoda, 2021, IEEE Transactions on Electron Devices.

T. Mogami, A. Hiraiwa, A. Nishida, 2011, IEEE Transactions on Electron Devices.

Atsushi Hiraiwa, Akio Nishida, A. Hiraiwa, 2010, Advanced Lithography.

H. Iwai, M. Ogasawara, Y. Itoh, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Atsushi Hiraiwa, Nariaki Ikeda, Koji Yano, 2017 .

H. Kawarada, A. Hiraiwa, Yuehang Xu, 2022, 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).

A. Hiraiwa, M. Kado, K. Danno, 2024, Journal of Vacuum Science & Technology B.

A. Hiraiwa, J. Yugami, 1990, Proceedings of the 1991 International Conference on Microelectronic Test Structures.

Atsushi Hiraiwa, A. Hiraiwa, A. Nishida, 2009 .