Jae-Duk Lee

Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells

Kinam Kim, Jeong-Hyuk Choi, Jae-Duk Lee, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Effects of floating-gate interference on NAND flash memory cell operation

Jungdal Choi, Jae-Duk Lee, S. Hur, 2002 .

Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells

Kinam Kim, Jeong-Hyuk Choi, Jae-Duk Lee, 2004 .

Capacitance Boosting by Anti-Ferroelectric Blocking Layer in Charge Trap Flash Memory Device

Jae-Duk Lee, B. Cho, Seung Hwan Lee, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

Scaling and reliability of NAND flash devices

Gyoyoung Jin, Youngwoo Park, Eunseung Jung, 2014, 2014 IEEE International Reliability Physics Symposium.