H. Pao

发表

The variable threshold transistor, a new electrically-alterable, non-destructive read-only storage device

R. E. Oleksiak, H. Wegener, A. Lincoln, 1967 .

Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors☆

C. Sah, H. Pao, 1966 .

The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors

C. Sah, H. Pao, 1966 .

MEMORY BEHAVIOR OF AN MNS CAPACITOR

H. Pao, M. O'Connell, Henry C. Pao, 1968 .

A simplified MIS method of measuring the semiconductor impurity concentration

H. Pao, 1968 .

The variable-threshold transistor, a new electrically-alterable, nondestructive READ-only storage device

R. E. Oleksiak, H.A.R. Wegener, H. Wegener, 1968 .

The Measurement of Fuel Evaporation in the Induction System During Warm-Up

H. Pao, H. C. Pao, 1982 .

Built-in space charge at junctions between heavily doped and semi-insulating GaAs layers

K. Lehovec, H. Pao, 1988 .