S. Ohkawa

Analysis and characterization of device variations in an LSI chip using an integrated device matrix array

S. Ohkawa, M. Aoki, H. Masuda, 2004 .

Challenge: variability characterization and modeling for 65- to 90-nm processes

Atsushi Kurokawa, Hiroo Masuda, Masakazu Aoki, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

Analysis and characterization of device variations in an LSI chip using an integrated device matrix array

H. Masuda, S. Ohkawa, M. Aoki, 2003, IEEE Transactions on Semiconductor Manufacturing.