T. Aichinger
发表
M. Nelhiebel,
T. Grasser,
H. Reisinger,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
M. Nelhiebel,
T. Grasser,
F. Schanovsky,
2011,
IEEE Transactions on Electron Devices.
M. Nelhiebel,
T. Grasser,
G. Pobegen,
2011,
2011 International Reliability Physics Symposium.
M. Nelhiebel,
T. Grasser,
B. Kaczer,
2009,
2009 IEEE International Reliability Physics Symposium.
Michael Nelhiebel,
Gregor Pobegen,
Thomas Aichinger,
2014
.
M. Nelhiebel,
T. Grasser,
T. Aichinger,
2009,
2009 IEEE International Reliability Physics Symposium.
M. Nelhiebel,
T. Grasser,
T. Aichinger,
2010,
IEEE Transactions on Device and Materials Reliability.
T. Grasser,
G. Pobegen,
T. Aichinger,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
M. Nelhiebel,
T. Grasser,
G. Pobegen,
2011,
2011 International Electron Devices Meeting.
M. Nelhiebel,
T. Grasser,
B. Kaczer,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
M. Nelhiebel,
T. Grasser,
B. Kaczer,
2009
.
Christian Steger,
Reinhold Weiss,
Armin Krieg,
2013,
Microprocess. Microsystems.
T. Grasser,
G. Pobegen,
T. Aichinger,
2019,
IEEE Transactions on Electron Devices.
Peter Friedrichs,
Lothar Frey,
Gregor Pobegen,
2015,
IEEE Transactions on Electron Devices.
G. Pobegen,
D. Peters,
T. Aichinger,
2017,
1709.08664.
M. Nelhiebel,
T. Aichinger,
2015
.
Tibor Grasser,
Gregor Pobegen,
Thomas Aichinger,
2014
.
T. Aichinger,
P. Hadley,
M. Koch,
2014
.
Tibor Grasser,
Michael Nelhiebel,
Gregor Pobegen,
2010,
2010 IEEE International Reliability Physics Symposium.
M. Nelhiebel,
G. Pobegen,
T. Aichinger,
2014
.
G. Pobegen,
A. Shluger,
T. Aichinger,
2018,
Journal of Applied Physics.
G. Pobegen,
A. Shluger,
T. Aichinger,
2016
.
H. B. Weber,
G. Pobegen,
T. Aichinger,
2018,
Materials Science Forum.
T. Aichinger,
M. Kaltenbacher,
M. Glavanovics,
2011,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
G. Pobegen,
T. Aichinger,
A. Regoutz,
2018
.
M. W. Feil,
T. Grasser,
K. Puschkarsky,
2020,
Crystals.
G. Pobegen,
A. Shluger,
T. Aichinger,
2019,
Materials Science Forum.
W. Bergner,
R. Siemieniec,
D. Peters,
2017
.
H. B. Weber,
G. Pobegen,
T. Aichinger,
2019,
Applied Physics Letters.
T. Aichinger,
J. Bailer,
Karl de Hueber,
2001
.
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2010,
2010 International Electron Devices Meeting.
M. Nelhiebel,
R. Degraeve,
M. Jurczak,
2017,
The FEBS journal.
G. Pobegen,
A. Shluger,
T. Aichinger,
2019,
Materials Science Forum.
Tibor Grasser,
Katja Puschkarsky,
Hans Reisinger,
2018,
IEEE Transactions on Device and Materials Reliability.
T. Grasser,
H. Reisinger,
W. Gustin,
2019,
IEEE Transactions on Electron Devices.
D. Peters,
T. Aichinger,
B. Tuttle,
2012
.
Katja Puschkarsky,
Hans Reisinger,
Thomas Basler,
2018,
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
G. Pobegen,
T. Aichinger,
J. Lischner,
2019,
Journal of Physics: Energy.
Gregor Pobegen,
Thomas Aichinger,
Gerald Rescher,
2018,
Microelectron. Reliab..
H. Reisinger,
S. Maaß,
T. Aichinger,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Tibor Grasser,
Katja Puschkarsky,
Hans Reisinger,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Tibor Grasser,
Gregor Pobegen,
Thomas Aichinger,
2018,
IEEE Transactions on Electron Devices.
Tibor Grasser,
Katja Puschkarsky,
Hans Reisinger,
2017,
2017 IEEE International Integrated Reliability Workshop (IIRW).
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2011,
2011 International Electron Devices Meeting.
Tibor Grasser,
Michael Nelhiebel,
Thomas Aichinger,
2008,
Microelectron. Reliab..
Ralf Siemieniec,
Thomas Basler,
Thomas Aichinger,
2017,
2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe).
Tibor Grasser,
Michael Nelhiebel,
Thomas Aichinger,
2013,
Microelectron. Reliab..
G. Pobegen,
T. Aichinger,
2021,
Wide Bandgap Semiconductors for Power Electronics.
G. Pobegen,
T. Grasser,
T. Aichinger,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
G. Pobegen,
T. Aichinger,
M. Krieger,
2019,
IEEE Transactions on Electron Devices.
G. Pobegen,
T. Aichinger,
P. Hadley,
2018
.
M. W. Feil,
T. Grasser,
H. Reisinger,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
T. Aichinger,
S. Pantelides,
B. Tuttle,
2013
.
Thomas Aichinger,
Judith Berens,
T. Aichinger,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
M. W. Feil,
M. Waltl,
H. Reisinger,
2023,
Communications Engineering.
M. W. Feil,
T. Grasser,
H. Reisinger,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Tibor Grasser,
Gregor Pobegen,
Thomas Aichinger,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
Hans Reisinger,
Katja Waschneck,
Thomas Aichinger,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Patrick M. Lenahan,
Thomas Aichinger,
D. Peters,
2013
.
M. W. Feil,
T. Aichinger,
P. Salmen,
2023,
Key Engineering Materials.
M. Nelhiebel,
T. Aichinger,
M. Nelhiebel,
2008,
IEEE Transactions on Device and Materials Reliability.
M. W. Feil,
H. Reisinger,
T. Aichinger,
2023,
Materials Science Forum.
G. Pobegen,
T. Aichinger,
G. Rescher,
2015
.
T. Grasser,
M. Nelhiebel,
T. Aichinger,
2009,
IEEE Transactions on Electron Devices.
B. Kaczer,
T. Grasser,
M. Nelhiebel,
2009,
2009 IEEE International Reliability Physics Symposium.
S. Mazumder,
S. Bahl,
T. Aichinger,
2023,
IEEE Journal of Emerging and Selected Topics in Power Electronics.
Ralf Siemieniec,
Thomas Basler,
Thomas Aichinger,
2017,
2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD).
M. Glavanovics,
Thomas Aichinger,
B. Findenig,
2020
.
T. Aichinger,
M. Schmidt,
T. Aichinger,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
T. Aichinger,
P. Lenahan,
2012
.
Tibor Grasser,
Gregor Pobegen,
Thomas Aichinger,
2018,
Materials Science Forum.
R. Esteve,
T. Aichinger,
W. Bergner,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
R. Siemieniec,
T. Aichinger,
David Kammerlander,
2019,
2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe).
Tibor Grasser,
Michael Nelhiebel,
Gregor Pobegen,
2011,
Microelectron. Reliab..