Praveen Elakkumanan

发表

A low-power current-mode clock distribution scheme for multi-GHz NoC-based SoCs

Ramalingam Sridhar, Ashok Narasimhan, Shantanu Divekar, 2005, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design.

High speed robust current sense amplifier for nanoscale memories: a winner take all approach

Ramalingam Sridhar, Praveen Elakkumanan, Srikanth Sundaram, 2006, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).

Low Power SER Tolerant Design to Mitigate Single Event Transients in Nanoscale Circuits

Ramalingam Sridhar, Kishan Prasad, Praveen Elakkumanan, 2005, J. Low Power Electron..

Overcoming the Circuit Design Challenges In Nanoscale SRAMs

Praveen Elakkumanan, 2006 .

Leakage Reduction for Domino Circuits in Sub-65nm Technologies

Ramalingam Sridhar, Praveen Elakkumanan, Manjari Agarwal, 2006, 2006 IEEE International SOC Conference.

Electrically driven optical proximity correction

Lars W. Liebmann, Michael Orshansky, Shayak Banerjee, 2008, SPIE Advanced Lithography.

RG-SRAM: a low gate leakage memory design

Ramalingam Sridhar, Praveen Elakkumanan, Charan Thondapu, 2005, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05).

Electrically driven optical proximity correction based on linear programming

Lars W. Liebmann, Michael Orshansky, Shayak Banerjee, 2008, ICCAD 2008.

Use of print-simulations in accelerated yield learning for 22nm BEOL technology

Praveen Elakkumanan, John Bolton, Ralf Buengener, 2010, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level

Ramalingam Sridhar, Praveen Elakkumanan, Manjari Agarwal, 2007, 2007 IEEE International SOC Conference.

Electrically driven optical proximity correction based on linear programming

Lars Liebmann, Michael Orshansky, Shayak Banerjee, 2008, 2008 IEEE/ACM International Conference on Computer-Aided Design.

Time redundancy based scan flip-flop reuse to reduce SER of combinational logic

Ramalingam Sridhar, Kishan Prasad, Praveen Elakkumanan, 2006, 7th International Symposium on Quality Electronic Design (ISQED'06).

Leakage aware SER reduction technique for UDSM logic circuits

Ramalingam Sridhar, Ashok Narasimhan, Praveen Elakkumanan, 2004, IEEE International SOC Conference, 2004. Proceedings..

SRAM local bit line access failure analyses

Kevin J. Nowka, Rouwaida Kanj, Sani R. Nassif, 2006, 7th International Symposium on Quality Electronic Design (ISQED'06).

Tutorial 6: Enhancing Yield through Design for Manufacturability (DFM)

Praveen Elakkumanan, 2008, 9th International Symposium on Quality Electronic Design (isqed 2008).

DG-SRAM: a low leakage memory circuit

Ramalingam Sridhar, Praveen Elakkumanan, Charan Thondapu, 2005, Proceedings 2005 IEEE International SOC Conference.