M. Denais
发表
V. Huard,
M. Denais,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
G. Ghibaudo,
J. Mitard,
F. Monsieur,
2005,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
G. Ribes,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
F. Monsieur,
V. Huard,
M. Denais,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
V. Huard,
M. Denais,
G. Ribes,
2004,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
C. Parthasarathy,
2005,
2005 IEEE International Integrated Reliability Workshop.
V. Huard,
M. Denais,
G. Ribes,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
V. Huard,
M. Denais,
C. Guérin,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
V. Huard,
M. Denais,
G. Ribes,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
V. Huard,
M. Denais,
G. Ribes,
2007,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
G. Ribes,
2006,
2006 IEEE International Conference on IC Design and Technology.
G. Ghibaudo,
T. Skotnicki,
G. Ribes,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
B. Tavel,
M. Bidaud,
M. Denais,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
G. Ribes,
M. Denais,
Vincent Huard,
2005,
Microelectron. Reliab..
G. Ghibaudo,
T. Skotnicki,
G. Ribes,
2006,
IEEE Transactions on Device and Materials Reliability.
M. Denais,
Vincent Huard,
C. R. Parthasarathy,
2006,
Microelectron. Reliab..
G. Ghibaudo,
T. Skotnicki,
F. Monsieur,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
G. Ribes,
M. Denais,
Gérard Ghibaudo,
2005,
Microelectron. Reliab..
G. Ghibaudo,
G. Ribes,
M. Denais,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
G. Ribes,
M. Denais,
D. Roy,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Gerard Ghibaudo,
G. Ribes,
M. Denais,
2004
.
M. Denais,
V. Huard,
A. Bravaix,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.
M. Denais,
Vincent Huard,
Nathalie Revil,
2005,
Microelectron. Reliab..