S. Saller

Reliability effects on MOS transistors due to hot-carrier injection

D. Scott, Kueing-Long Chen, S. Saller, 1985 .

Improvement of linewidth control with antireflective coating in optical lithography

W. Hunter, S. Saller, Yi-Ching Lin, 1984 .

Direct moat isolation for VLSI

S.A. Saller, P.K. Chatterjee, P. Chatterjee, 1982, 1981 International Electron Devices Meeting.

Hybrid Systems in foil (HySiF) exploiting ultra-thin flexible chips

Joachim N. Burghartz, Zili Yu, Christine Harendt, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

The case of AC stress in the hot-carrier effect

Kueing-Long Chen, S. Saller, R. Shah, 1986, IEEE Transactions on Electron Devices.

Reliability effects on MOS transistors due to hot-carrier injection

S.A. Saller, Kueing-Long Chen, D. Scott, 1985, IEEE Transactions on Electron Devices.