C. Young
发表
G. Bersuker,
R. Choi,
J. Sim,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
G. Bersuker,
B. Lee,
R. Choi,
2009,
IEEE Transactions on Electron Devices.
P. Kirsch,
K. Akarvardar,
P. Majhi,
2010,
2010 International Electron Devices Meeting.
J.C. Lee,
G. Bersuker,
B.H. Lee,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Chang Yong Kang,
Byoung Hun Lee,
Sung Woo Kim,
2008,
2008 IEEE International Reliability Physics Symposium.
S. Banerjee,
C. Young,
D. Shahrjerdi,
2014
.
S. Banerjee,
C. Young,
D. Shahrjerdi,
2013
.
K. Akarvardar,
C. Young,
M. Baykan,
2013
.
P. Hurley,
G. Ghibaudo,
P. Majhi,
2009
.
G. Bersuker,
C. Young,
D. Ang,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Bersuker,
C. Young,
D. Ang,
2013,
IEEE Electron Device Letters.
George A. Brown,
G. Bersuker,
K. Matthews,
2005
.
G. Bersuker,
R. Bergmann,
G. Gebara,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
D. Gilmer,
P. Kirsch,
P. Majhi,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
G. Bersuker,
D. Veksler,
C. Young,
2009,
2009 IEEE International Integrated Reliability Workshop Final Report.
D. Gilmer,
G. Bersuker,
H. Hwang,
2010,
Proceedings of 2010 International Symposium on VLSI Technology, System and Application.
George A. Brown,
G. Bersuker,
P. Lysaght,
2003
.
P. Kirsch,
Daehyun Kim,
J. D. del Alamo,
2013,
IEEE Electron Device Letters.
P. Kirsch,
Daehyun Kim,
J. Alamo,
2013
.
D. Veksler,
P. Kirsch,
J. D. del Alamo,
2012,
2012 Symposium on VLSI Technology (VLSIT).
Moon J. Kim,
Christopher M. Smyth,
Lee A. Walsh,
2018,
ACS Applied Nano Materials.
Christopher M. Smyth,
P. Hurley,
R. Wallace,
2017,
2017 International Conference of Microelectronic Test Structures (ICMTS).
G. Bersuker,
M. Gardner,
P. Zeitzoff,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
G. Bersuker,
B. Lee,
R. Choi,
2005
.
Patrick M. Lenahan,
Byoung Hun Lee,
G. Bersuker,
2006
.
G. Bersuker,
P. Kirsch,
A. Kingon,
2007
.
G. Bersuker,
P. Kirsch,
H. Lee,
2007
.
G. Bersuker,
R. Jammy,
P. Majhi,
2006,
2009 Symposium on VLSI Technology.
G. Bersuker,
R. Choi,
P. Majhi,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
G. Bersuker,
K. Matthews,
P. Kirsch,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
G. Bersuker,
B. Lee,
R. Choi,
2006,
IEEE Electron Device Letters.
G. Bersuker,
R. Choi,
C. Young,
2007,
IEEE Electron Device Letters.
R. Jammy,
P. D. Kirsch,
P. Majhi,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
P. Y. Hung,
T. Ngai,
R. Jammy,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
S. Gausepohl,
P. Kirsch,
K. Akarvardar,
2012,
IEEE Electron Device Letters.
M. Shur,
G. Bersuker,
D. Veksler,
2011
.
P. Hurley,
R. Wallace,
C. Young,
2018,
2018 IEEE International Conference on Microelectronic Test Structures (ICMTS).
B. H. Lee,
G. Bersuker,
J. Peterson,
2004
.
G. Bersuker,
K. Matthews,
Y. Kim,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
Jaebeom Lee,
C. Young,
L. Colombo,
2017
.
R. Chapman,
C. Young,
R. Rodriguez-Davila,
2019,
Microelectronic Engineering.
J. Suehle,
K. Cheung,
C. Young,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Bersuker,
R. Choi,
C. Young,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.
G. Bersuker,
B. Lee,
R. Choi,
2005
.
P. Hurley,
R. Wallace,
G. Mirabelli,
2021
.
Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO2/Al2O3/MoS2 System
L. Larcher,
A. Padovani,
P. Hurley,
2019,
ACS Applied Electronic Materials.
J. R. Ramos-Serrano,
C. Young,
I. Mejia,
2019,
Materials Research Express.
E. Vogel,
C. Richter,
C. Young,
2006
.
E. Vogel,
C. Richter,
C. Young,
2003
.
G. Bersuker,
R. Choi,
P. Majhi,
2005,
IEEE Electron Device Letters.
L. Larcher,
A. Padovani,
G. Bersuker,
2011
.
C. Young,
Hyunsang Hwang,
Byoung Hun Lee,
2005,
IEEE Electron Device Letters.
G. Bersuker,
B. Lee,
R. Choi,
2006,
2006 European Solid-State Device Research Conference.
L. Larcher,
T. Ngai,
G. Bersuker,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Moon J. Kim,
Christopher M. Smyth,
R. Wallace,
2019,
2D Materials.
C. Young,
M. Quevedo-López,
J. Avila-Avendano,
2018
.
David J. Smith,
C. Young,
M. McCartney,
2020,
Advanced Materials Interfaces.
P. Hurley,
R. Wallace,
G. Mirabelli,
2018
.
Robert M. Wallace,
Paul K. Hurley,
Chadwin D. Young,
2018,
Applied Physics Letters.
Christopher M. Smyth,
P. Hurley,
R. Wallace,
2019,
ACS Applied Electronic Materials.
P. Hurley,
R. Wallace,
C. Young,
2017,
ACS applied materials & interfaces.
Q. Wang,
G. Bersuker,
B.H. Lee,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
Jaebeom Lee,
C. Young,
L. Colombo,
2018,
Applied Physics Letters.
Jaebeom Lee,
C. Young,
L. Colombo,
2018
.
R. Choi,
C. Young,
Namhun Kim,
2020,
Materials.
C. Young,
Xuan Zeng,
P. Zhao,
2019,
Nanotechnology.
Jack C. Lee,
G. Bersuker,
P. Kirsch,
2005
.
Chang Seo Park,
G. Bersuker,
B. Lee,
2007,
IEEE Transactions on Device and Materials Reliability.
Jaebeom Lee,
C. Young,
L. Colombo,
2019,
Applied Physics Letters.
Byoung Hun Lee,
Dim-Lee Kwong,
Gennadi Bersuker,
2005
.
R. Jammy,
P. D. Kirsch,
K. Matthews,
2012,
2012 International Electron Devices Meeting.
K. Akarvardar,
W. Loh,
R. Jammy,
2011,
11th International Workshop on Junction Technology (IWJT).
Howard R. Huff,
Byoung Hun Lee,
G. Bersuker,
2005
.
G. Bersuker,
B. Lee,
R. Choi,
2006
.
Byoung Hun Lee,
Gennadi Bersuker,
Peter Zeitzoff,
2004,
Microelectron. Reliab..
Howard R. Huff,
Byoung Hun Lee,
Gennadi Bersuker,
2004
.
P. Hurley,
R. Wallace,
C. Young,
2015
.
Jaebeom Lee,
C. Young,
L. Colombo,
2019,
ACS applied materials & interfaces.
C. Young,
H. Alshareef,
M. Quevedo-López,
2016
.
P. Hurley,
R. Wallace,
C. Young,
2017
.
P. Hurley,
R. Wallace,
C. Young,
2017
.
P. Hurley,
R. Wallace,
G. Mirabelli,
2018
.
P. Hurley,
R. Wallace,
C. Young,
2017
.
K. Matthews,
K. Akarvardar,
P. Majhi,
2012
.
L. Larcher,
G. Bersuker,
R. Jammy,
2008,
2008 IEEE International Electron Devices Meeting.
Gennadi Bersuker,
James H. Stathis,
Salvatore Lombardo,
2008,
Microelectron. Reliab..
G. Bersuker,
D. Misra,
R. Choi,
2007
.
Nebojsa D. Jankovic,
Chadwin D. Young,
C. Young,
2016,
Microelectron. Reliab..
Hsing-Huang Tseng,
S. Datta,
R. Jammy,
2008,
IEEE Electron Device Letters.
Muhammad Mustafa Hussain,
Gennadi Bersuker,
Jhonathan P. Rojas,
2015,
IEEE Transactions on Reliability.
G. Bersuker,
P. Zeitzoff,
B.H. Lee,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
L. Larcher,
G. Bersuker,
D. S. Ang,
2010,
2010 IEEE International Reliability Physics Symposium.
Moon J. Kim,
C. Young,
Young-Chul Byun,
2017
.
G. Bersuker,
R. Jammy,
B.H. Lee,
2006,
2006 International Electron Devices Meeting.
C. Young,
R. Hawkins,
2022,
Journal of Vacuum Science & Technology A.
M. Shur,
G. Bersuker,
R. Jammy,
2010,
2010 IEEE International Reliability Physics Symposium.
R. Chapman,
C. Young,
R. Rodriguez-Davila,
2019,
IEEE Transactions on Electron Devices.
D. Gilmer,
G. Bersuker,
P. Kirsch,
2008,
Symposium on VLSI Technology.
P. Hurley,
G. Ghibaudo,
P. Majhi,
2007
.
Byoung Hun Lee,
Gennadi Bersuker,
Rino Choi,
2010
.
D. Gilmer,
G. Bersuker,
P. Kirsch,
2007,
2007 IEEE International Electron Devices Meeting.
G. Bersuker,
B. Lee,
R. Choi,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Hongfa Luan,
Kisik Choi,
Byoung Hun Lee,
2006,
IEEE Electron Device Letters.
G. Bersuker,
J. Hauser,
C. Young,
2005,
IEEE Electron Device Letters.
G. Bersuker,
R. Jammy,
P. Majhi,
2006,
2009 Symposium on VLSI Technology.
G. Bersuker,
P. Kirsch,
K. Akarvardar,
2011,
2011 International Semiconductor Device Research Symposium (ISDRS).
Husam N. Alshareef,
Muhammad Mustafa Hussain,
Gennadi Bersuker,
2008
.
Hsing-Huang Tseng,
R. Jammy,
M.M. Hussain,
2010,
IEEE Transactions on Electron Devices.
Additive Process Induced Strain (APIS) Technology for L g = 30nm Band-Edge High-k/Metal Gate nMOSFET
P. Kirsch,
S. Suthram,
R. Jammy,
2008
.
G. Bersuker,
R. Jammy,
B.H. Lee,
2006,
2006 International Electron Devices Meeting.
D. Gilmer,
G. Bersuker,
P. Kirsch,
2006,
2009 Symposium on VLSI Technology.
G. Bersuker,
P. Kirsch,
C. Kang,
2009,
2009 International Symposium on VLSI Technology, Systems, and Applications.
P. Hurley,
R. Wallace,
C. Young,
2016,
2016 International Conference on Microelectronic Test Structures (ICMTS).
Pavel Bolshakov,
Chadwin D. Young,
Rodolfo A. Rodriguez-Davila,
2019,
IEEE International Reliability Physics Symposium.
C. Young,
R. Rodriguez-Davila,
M. Quevedo-López,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Paul K. Hurley,
Peng Zhao,
Chadwin D. Young,
2016
.
En Xia Zhang,
Gennadi Bersuker,
Ronald D. Schrimpf,
2014,
IEEE Transactions on Nuclear Science.
R. Bergmann,
G. Bersuker,
P. Zeitzoff,
2001,
Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537).
R. Wallace,
C. Young,
M. Quevedo-López,
2019,
ECS Transactions.
M. Hussein,
G. Bersuker,
K. Matthews,
2010,
IEEE Electron Device Letters.
G. Bersuker,
D. Veksler,
K. Matthews,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Bersuker,
D. Veksler,
C. Young,
2011,
2011 International Reliability Physics Symposium.
J. Suehle,
K. Cheung,
C. Young,
2011
.
Byoung Hun Lee,
Gennadi Bersuker,
Rino Choi,
2007,
Microelectron. Reliab..
G. Bersuker,
R. Jammy,
H. Tseng,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
G. Bersuker,
G.A. Brown,
G. Bersuker,
2007,
IEEE Transactions on Electron Devices.
Gennadi Bersuker,
Eric M. Vogel,
Alain C. Diebold,
2006
.