Jean-Louis Carbonéro
发表
Salvador Mir,
Jeanne Tongbong,
Jean-Louis Carbonéro,
2007,
2007 Design, Automation & Test in Europe Conference & Exhibition.
Smail Tedjini,
Vincent Beroulle,
Chantal Robach,
2008,
IEEE Design & Test of Computers.
Salvador Mir,
Ahcène Bounceur,
Luís Rolíndez,
2006,
J. Electron. Test..
Smail Tedjini,
Vincent Beroulle,
Chantal Robach,
2007,
2007 IFIP International Conference on Very Large Scale Integration.
Salvador Mir,
Jean-Louis Carbonéro,
V. Danelon,
2005,
Design, Automation and Test in Europe.
Smail Tedjini,
Vincent Beroulle,
Chantal Robach,
2008,
VLSI Design.
Smail Tedjini,
Vincent Beroulle,
Chantal Robach,
2006,
2006 IEEE Design and Diagnostics of Electronic Circuits and systems.
Salvador Mir,
Ahcène Bounceur,
Luís Rolíndez,
2006,
24th IEEE VLSI Test Symposium.
Hervé Lapuyade,
Yann Deval,
Jean-Baptiste Begueret,
2009,
2009 International Test Conference.
Hervé Lapuyade,
Yann Deval,
Jean-Baptiste Begueret,
2010,
J. Electron. Test..