J. Campbell
发表
J. Suehle,
K. Cheung,
R. Southwick,
2012,
2012 IEEE Silicon Nanoelectronics Workshop (SNW).
S. T. Liu,
J. Campbell,
A. Y. Kang,
2001
.
J. Suehle,
K. Sheng,
K. Cheung,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
A. Krishnan,
S. Krishnan,
J. Campbell,
2008
.
S. Krishnan,
A. Krishnan,
J. Campbell,
2011,
IEEE Transactions on Device and Materials Reliability.
S. Krishnan,
A. Krishnan,
J. Campbell,
2005
.
A. Krishnan,
S. Krishnan,
J. Campbell,
2006
.
J. Suehle,
K. Sheng,
K. Cheung,
2011,
IEEE Electron Device Letters.
Patrick M. Lenahan,
J. Campbell,
P. Lenahan,
2002
.
K. Cheung,
J. Campbell,
2011,
11th International Workshop on Junction Technology (IWJT).
J. Suehle,
K. Cheung,
R. Southwick,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
J. Campbell,
M. Wanlass,
T. Gfroerer,
2005
.
D. Veksler,
K. Cheung,
J. Campbell,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
S. Krishnan,
A. Krishnan,
J. Campbell,
2007
.
J. Suehle,
K. Cheung,
R. Southwick,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
J. Suehle,
K. Cheung,
C. Young,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Bersuker,
J. Campbell,
P. Lenahan,
2007
.
K. Cheung,
J. Campbell,
J. Ryan,
2015,
2015 International Symposium on VLSI Technology, Systems and Applications.
A. Oates,
K. P. Cheung,
J. P. Campbell,
2011,
IEEE Electron Device Letters.
J. Campbell,
2005
.
Z. Chbili,
K. Cheung,
J. Campbell,
2017,
2017 IEEE International Integrated Reliability Workshop (IIRW).
Patrick M. Lenahan,
J. Campbell,
P. Lenahan,
2002
.
J. Suehle,
K. Cheung,
J. Campbell,
2011,
2011 International Reliability Physics Symposium.