N. Zanolla

Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias

C. Fiegna, E. Sangiorgi, N. Zanolla, 2010, IEEE Transactions on Electron Devices.

Measurement and simulation of gate voltage dependence of RTS emission and capture time constants in MOSFETs

C. Fiegna, E. Sangiorgi, N. Zanolla, 2008, 2008 9th International Conference on Ultimate Integration of Silicon.

Characterization and modeling of low-frequency noise in MOSFETs

Nicola Zanolla, N. Zanolla, 2009 .

Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias

M. Tiebout, D. Siprak, P. Baumgartner, 2009, IEEE Journal of Solid-State Circuits.