K. Rott
发表
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 IEEE International Reliability Physics Symposium.
T. Grasser,
M. Waltl,
F. Schanovsky,
2013,
2013 IEEE International Electron Devices Meeting.
T. Grasser,
M. Waltl,
F. Schanovsky,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
M. Waltl,
F. Schanovsky,
2014,
IEEE Transactions on Electron Devices.
T. Grasser,
H. Reisinger,
B. Kaczer,
2012,
2012 International Electron Devices Meeting.
T. Grasser,
M. Waltl,
G. Rzepa,
2014,
2014 IEEE International Electron Devices Meeting.
T. Grasser,
M. Waltl,
H. Reisinger,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
T. Grasser,
H. Reisinger,
B. Kaczer,
2015,
IEEE Transactions on Electron Devices.
Tibor Grasser,
Hans Reisinger,
Christian Schlünder,
2012,
Microelectron. Reliab..
Tibor Grasser,
Jacopo Franco,
Ben Kaczer,
2014,
2014 IEEE International Conference on IC Design & Technology.
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).