D. Heh
发表
G. Bersuker,
B. Lee,
R. Choi,
2009,
IEEE Transactions on Electron Devices.
G. Bersuker,
D. Heh,
C. Hinkle,
2010,
IEEE Transactions on Electron Devices.
S. Koveshnikov,
S. Datta,
V. Tokranov,
2008,
2008 IEEE International Electron Devices Meeting.
Chang Yong Kang,
Byoung Hun Lee,
Sung Woo Kim,
2008,
2008 IEEE International Reliability Physics Symposium.
E. Vogel,
D. Heh,
J. Bernstein,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
J. Suehle,
G. Bersuker,
K. Cheung,
2008,
IEEE International Reliability Physics Symposium.
D. Gilmer,
P. Kirsch,
P. Majhi,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
L. Larcher,
A. Padovani,
G. Bersuker,
2009,
IEEE Electron Device Letters.
R. Jammy,
P. Majhi,
R. Choi,
2008,
IEEE Electron Device Letters.
J.C. Lee,
Hsing-Huang Tseng,
Byoung Hun Lee,
2007,
IEEE Electron Device Letters.
J. M. Kowalski,
Chia-Chen Wan,
Yao-Jen Lee,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
G. Bersuker,
P. Kirsch,
A. Kingon,
2007
.
G. Bersuker,
P. Kirsch,
H. Lee,
2007
.
Eric M. Vogel,
Joseph B. Bernstein,
Dawei Heh,
2003
.
G. Bersuker,
R. Jammy,
P. Majhi,
2006,
2009 Symposium on VLSI Technology.
George A. Brown,
G. Bersuker,
E. Vogel,
2006
.
G. Bersuker,
B. Lee,
R. Choi,
2006,
IEEE Electron Device Letters.
J. Suehle,
E. Vogel,
E. Gusev,
2004,
IEEE Electron Device Letters.
G. Bersuker,
R. Choi,
C. Young,
2007,
IEEE Electron Device Letters.
B. H. Lee,
Jack C. Lee,
P. Kirsch,
2008
.
R. Jammy,
P. Majhi,
R. Choi,
2007,
2007 IEEE International Electron Devices Meeting.
Gennadi Bersuker,
John S. Suehle,
Yoram Shapira,
2007
.
Jiu-Haw Lee,
D. Heh,
Kuei-Hsien Chen,
2013,
Nano letters.
D. Heh,
C. Ai,
Yu-Chen Li,
2011
.
G. Bersuker,
R. Choi,
C. Young,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.
G. Bersuker,
B. Lee,
R. Choi,
2006,
2006 European Solid-State Device Research Conference.
J. Suehle,
E. Vogel,
E. Gusev,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
L. Larcher,
G. Bersuker,
R. Jammy,
2008,
2008 IEEE International Electron Devices Meeting.
G. Bersuker,
P. Zeitzoff,
B.H. Lee,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
L. Larcher,
G. Bersuker,
D. S. Ang,
2010,
2010 IEEE International Reliability Physics Symposium.
G. Bersuker,
R. Jammy,
B.H. Lee,
2006,
2006 International Electron Devices Meeting.
D. Heh,
Li-Jung Liu,
K. Chang-Liao,
2012,
IEEE Electron Device Letters.
D. Gilmer,
G. Bersuker,
P. Kirsch,
2008,
Symposium on VLSI Technology.
Byoung Hun Lee,
Gennadi Bersuker,
Rino Choi,
2010
.
Kin Leong Pey,
G. Bersuker,
D. S. Ang,
2009
.
G. Bersuker,
P. Kirsch,
R. Jammy,
2009,
2009 Proceedings of the European Solid State Device Research Conference.
E. Vogel,
D. Heh,
J. Bernstein,
2002
.
M. Tsai,
D. Heh,
P. Gu,
2011
.
G. Bersuker,
R. Jammy,
P. Majhi,
2006,
2009 Symposium on VLSI Technology.
G. Bersuker,
R. Jammy,
B.H. Lee,
2006,
2006 International Electron Devices Meeting.
D. Gilmer,
G. Bersuker,
P. Kirsch,
2006,
2009 Symposium on VLSI Technology.
M. Hussein,
G. Bersuker,
K. Matthews,
2010,
IEEE Electron Device Letters.
Byoung Hun Lee,
Gennadi Bersuker,
Rino Choi,
2007,
Microelectron. Reliab..
G. Bersuker,
G.A. Brown,
G. Bersuker,
2007,
IEEE Transactions on Electron Devices.
Gennadi Bersuker,
Eric M. Vogel,
Alain C. Diebold,
2006
.
Byoung Hun Lee,
G. Bersuker,
Rino Choi,
2006,
IEEE Transactions on Device and Materials Reliability.
G. Bersuker,
E. Vogel,
J. Peterson,
2005,
2005 IEEE International Integrated Reliability Workshop.