Josep Rius Vázquez
发表
Pablo Maqueda,
Josep Rius Vázquez,
2009,
2009 15th IEEE International On-Line Testing Symposium.
Joan Figueras,
Josep Rius Vázquez,
J. Figueras,
1999,
DATE.
Josep Rius Vázquez,
2010,
INSS.
José Pineda de Gyvez,
Josep Rius Vázquez,
2004,
Proceedings Design, Automation and Test in Europe Conference and Exhibition.
Rosa Rodríguez-Montañés,
Joan Figueras,
Antoni Ferré,
1998,
Integr..
José Pineda de Gyvez,
Josep Rius Vázquez,
Maurice Meijer,
2005,
PATMOS.
Bram Kruseman,
Josep Rius Vázquez,
Stefan van den Oetelaar,
2002,
Proceedings. International Test Conference.
José Pineda de Gyvez,
Josep Rius Vázquez,
Maurice Meijer,
2006,
J. Low Power Electron..
Josep Rius Vázquez,
2015,
IEEE Trans. Very Large Scale Integr. Syst..
Salvador Manich,
Rosa Rodriguez-Sánchez,
Josep Rius Vázquez,
2003,
PATMOS.
Josep Rius Vázquez,
Maurice Meijer,
2009,
IEEE Journal of Solid-State Circuits.
Joan Figueras,
Josep Rius Vázquez,
J. Figueras,
1992,
J. Electron. Test..
Josep Rius Vázquez,
2013,
IEEE Trans. Very Large Scale Integr. Syst..
Salvador Manich,
Rosa Rodríguez-Montañés,
Joan Figueras,
2004,
22nd IEEE VLSI Test Symposium, 2004. Proceedings..
Josep Rius Vázquez,
2010,
IOLTS.
Josep Rius Vázquez,
2010,
BODYNETS.
José Pineda de Gyvez,
Josep Rius Vázquez,
2004,
22nd IEEE VLSI Test Symposium, 2004. Proceedings..
Josep Rius Vázquez,
Maurice Meijer,
Luis Elvira Villagra,
2009,
2009 14th IEEE European Test Symposium.
Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments
Josep Rius Vázquez,
Joan Figueras,
1996,
J. Electron. Test..
Josep Rius Vázquez,
Joan Figueras,
1995,
Proceedings 13th IEEE VLSI Test Symposium.
Salvador Manich,
Joan Figueras,
L. Balado,
2003,
The Eighth IEEE European Test Workshop, 2003. Proceedings..