Q. Ding

Impact of process variation on soft error vulnerability for nanometer VLSI circuits

Rong Luo, Yuan Xie, Qian Ding, 2005, 2005 6th International Conference on ASIC.

Output remapping technique for critical paths soft-error rate reduction

Rong Luo, Yu Wang, Huazhong Yang, 2010, IET Comput. Digit. Tech..

Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths

Yu Wang, Huazhong Yang, Q. Ding, 2008, 9th International Symposium on Quality Electronic Design (isqed 2008).

Modeling the Impact of Process Variation on Critical Charge Distribution

Rong Luo, Hui Wang, Huazhong Yang, 2006, 2006 IEEE International SOC Conference.