F. Karimi

Using data compression in automatic test equipment for system-on-chip testing

Fabrizio Lombardi, Waleed Meleis, Zainalabedin Navabi, 2004, IEEE Transactions on Instrumentation and Measurement.

Hybrid multisite testing at manufacturing

Fabrizio Lombardi, Fred J. Meyer, Hamidreza Hashempour, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Data compression for system-on-chip testing using ATE

Fabrizio Lombardi, Waleed Meleis, Zainalabedin Navabi, 2002, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..

Applications of decorator and observer design patterns in functional verification

Farzin Karimi, F. Karimi, 2008, 2008 IEEE International High Level Design Validation and Test Workshop.