Dong-gun Park

Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells

Kinam Kim, Jeong-Hyuk Choi, Jae-Duk Lee, 2004 .

Nanoscale silicon-oxide-nitride-oxide-silicon (SONOS) structure and its applications

Byung-Gook Park, Dong-gun Park, Yong Kyu Lee, 2004, Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004..

Reliability of Thin Si02 at Direct-Thnneling Voltages

C. Hu, K. Schuegraf, Dong-gun Park, 1994 .