P. Kozłowski
发表
H. Nayfeh,
M. Ieong,
J. Kedzierski,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
L. H. Vanamurth,
D. Yang,
T. Adam,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
J. Treichler,
K. Guarini,
G. Cohen,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
Anna W. Topol,
P. Kirsch,
K. Guarini,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
T. Adam,
J. Holt,
B. Haran,
2006,
2009 Symposium on VLSI Technology.
O. Gluschenkov,
K.K. Chan,
R.M. Sicina,
2003,
IEEE Electron Device Letters.
Kevin K. H. Chan,
E. Cartier,
A. Ajmera,
2000
.
L. Ragnarsson,
E. Cartier,
E. Gusev,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
Evgeni P. Gusev,
Huiling Shang,
Christopher P. D'Emic,
2004
.
W. Haensch,
H.-S.P. Wong,
J. Ott,
2002,
Digest. International Electron Devices Meeting,.
Self-aligned n-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate
H.-S.P. Wong,
W. Haensch,
P. Kozlowski,
2004,
IEEE Electron Device Letters.
Indium-Based Micro-Bump Array Fabrication Technology with Added Pre-Reflow Wet Etching and Annealing
K. Regiński,
P. Kozłowski,
K. Czuba,
2021,
Materials.
P. Oldiges,
K. Maitra,
V. Narayanan,
2005,
IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech)..
P. Kozłowski,
K. Czuba,
A. Jasik,
2022,
Infrared Physics & Technology.
A. Simon,
D. Edelstein,
C. Cabral,
2010,
2010 International Electron Devices Meeting.
P. Kozłowski,
K. Czuba,
A. Jasik,
2020,
Crystals.
J. Benedict,
J. Treichler,
H.-S.P. Wong,
2003,
IEEE Circuits and Devices Magazine.
D. Boyd,
J. Kedzierski,
C. Cabral,
2005,
IEEE Transactions on Electron Devices.
A. Simon,
D. Edelstein,
C. Cabral,
2010,
2010 IEEE International Interconnect Technology Conference.
J. Kedzierski,
R. Carruthers,
C. Cabral,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
A. Mocuta,
R. Arndt,
A. Ajmera,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
H.-S.P. Wong,
E.C. Jones,
P. Kozlowski,
2003,
IEEE Electron Device Letters.
B. Jagannathan,
N. Loubet,
P. Kulkarni,
2010,
Proceedings of 2010 International Symposium on VLSI Technology, System and Application.
A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping
P. Kozłowski,
K. Czuba,
A. Jasik,
2021,
Materials.