C. Parthasarathy
发表
G. Ghibaudo,
J. Mitard,
F. Monsieur,
2005,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
G. Ribes,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
V. Huard,
N. Planes,
C. Parthasarathy,
2008,
2008 IEEE International Reliability Physics Symposium.
V. Huard,
M. Denais,
G. Ribes,
2004,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
C. Parthasarathy,
2005,
2005 IEEE International Integrated Reliability Workshop.
V. Huard,
M. Denais,
G. Ribes,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
M. Houssa,
C. Parthasarathy,
N. Revil,
2003
.
V. Huard,
M. Denais,
G. Ribes,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
V. Huard,
M. Denais,
G. Ribes,
2007,
IEEE Transactions on Device and Materials Reliability.
V. Huard,
M. Denais,
G. Ribes,
2006,
2006 IEEE International Conference on IC Design and Technology.
M. Houssa,
C. Parthasarathy,
N. Revil,
2003
.
Edith Beigné,
Bastien Giraud,
Jean-Philippe Noel,
2017,
IEEE Transactions on Circuits and Systems I: Regular Papers.
V. Huard,
C. Parthasarathy,
C. Guerin,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
M. Denais,
Vincent Huard,
C. R. Parthasarathy,
2006,
Microelectron. Reliab..
Nicolas Planes,
Vincent Huard,
Florian Cacho,
2010,
2010 IEEE International Reliability Physics Symposium.
V. Huard,
A. Bravaix,
E. Vincent,
2007,
IEEE Transactions on Device and Materials Reliability.
M. Denais,
Vincent Huard,
Nathalie Revil,
2005,
Microelectron. Reliab..