K. Pey
发表
X. A. Tran,
Y. Yeo,
B. Nguyen,
2011,
2011 International Electron Devices Meeting.
H. Iwai,
K. Pey,
K. Kakushima,
2011
.
J. Stathis,
B. Linder,
K. Pey,
2005
.
K. Pey,
W. Lin,
Chih-Hang Tung,
2005,
IEEE Transactions on Electron Devices.
G. Lo,
K. Pey,
N. Ranganathan,
2011,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
K. Pey,
D. Ang,
2004,
IEEE Electron Device Letters.
L. Larcher,
A. Padovani,
K. Pey,
2014,
IEEE Electron Device Letters.
K. Pey,
N. Raghavan,
S. O’Shea,
2020
.
K. Pey,
N. Raghavan,
M. Bosman,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
L. Larcher,
A. Padovani,
G. Bersuker,
2010,
IEEE Electron Device Letters.
K. Pey,
N. Raghavan,
M. Bosman,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
X. Wu,
K. Pey,
N. Raghavan,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
X. A. Tran,
Y. Yeo,
B. Nguyen,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
F. Che,
K. Pey,
C. Gan,
2012,
Journal of Electronic Materials.
K. Pey,
A. Wee,
D. Mangelinck,
2000,
IEEE Electron Device Letters.
Kin Leong Pey,
Hun-Jan Tao,
Da-Yuan Lee,
2010
.
Kin Leong Pey,
N. Balasubramanian,
N. Balasubramanian,
2008
.
Nagarajan Raghavan,
Michel Bosman,
Gang Zhang,
2011,
Nanotechnology.
K. Pey,
A. Wee,
C. Troadec,
2007
.
T. Kauerauf,
X. Wu,
K. Pey,
2011,
IEEE Electron Device Letters.
K. Pey,
D. Y. Lee,
N. Ranganathan,
2010
.
A. See,
K. Pey,
L. W. Chu,
2001,
Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).
K. Pey,
C. Gan,
T. L. Tan,
2006,
IEEE Electron Device Letters.
Kin Leong Pey,
Hailong Liu,
Ravikumar Venkat Krishnan,
2019,
Optical Materials Express.
Kin Leong Pey,
N. Balasubramanian,
N. Balasubramanian,
2008
.
L. Wu,
K. Pey,
H. Tao,
2010,
Proceedings of 2010 International Symposium on VLSI Technology, System and Application.
X. Wu,
K. Pey,
M. Bosman,
2010
.
K. Pey,
C. Tung,
D. Ang,
2006,
IEEE Electron Device Letters.
V.L. Lo,
K. Pey,
C. Tung,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Salvatore Lombardo,
Kin Leong Pey,
Felix Palumbo,
2003
.
K. Pey,
N. Raghavan,
M. Bosman,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
T. Kauerauf,
N. Raghavan,
X. Wu,
2011,
2011 International Reliability Physics Symposium.
K. Pey,
N. Raghavan,
M. Bosman,
2012
.
C. Thompson,
K. Pey,
C. Gan,
2009
.
K. Pey,
H. Zheng,
X. Wang,
2010,
Optics express.
K. Pey,
Lianjun Liu,
P. Foo,
1996,
Proceedings 1996 IEEE Hong Kong Electron Devices Meeting.
Pooi See Lee,
K. Pey,
P. Lee,
2010
.
K. Pey,
H. Zheng,
X. Wang,
2009,
Proceedings of the 2009 12th International Symposium on Integrated Circuits.
K. Pey,
C. Tung,
G. Lim,
2006,
IEEE Electron Device Letters.
K. Pey,
S. O’Shea,
Shubhakar Kalya,
2017
.
L. Larcher,
A. Padovani,
F. Puglisi,
2016
.
S. Mahapatra,
K. Pey,
P. K. Singh,
2012
.
S. Mahapatra,
K. Pey,
P. K. Singh,
2010,
IEEE Transactions on Electron Devices.
K. Pey,
Hailang Qin,
C. Troadec,
2012
.
D. Antoniadis,
E. Fitzgerald,
K. Pey,
2010
.
Shurong Dong,
W. S. Lau,
Hei Wong,
2016,
Microelectron. Reliab..
Qi Liu,
Litao Sun,
K. Pey,
2018,
Advanced science.
Y. Chong,
K. Pey,
H. Gossmann,
2004
.
Pooi See Lee,
K. Pey,
D. Mangelinck,
2004
.
S. Mahapatra,
K. Pey,
P. K. Singh,
2011
.
S. Mahapatra,
K. Pey,
P. K. Singh,
2011,
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Mahapatra,
K. Pey,
P. K. Singh,
2010,
2010 IEEE International Reliability Physics Symposium.
Xing Wu,
Nagarajan Raghavan,
Michel Bosman,
2016,
Microelectron. Reliab..
N. Raghavan,
K. Pey,
N. Raghavan,
2019,
Microelectronic Engineering.
K. Pey,
C. Gan,
J. Tan,
2011
.
Shurong Dong,
W. S. Lau,
Hei Wong,
2016,
Microelectron. Reliab..
Xing Wu,
K. Pey,
N. Raghavan,
2012,
IEEE Electron Device Letters.
R. Ranjan,
C. Tung,
E. Miranda,
2007
.
K. Novoselov,
Kenji Watanabe,
T. Taniguchi,
2021,
ACS Applied Electronic Materials.
K. Pey,
H. Demir,
B. Guzelturk,
2010,
2010 IEEE Photinic Society's 23rd Annual Meeting.
K. Pey,
R. Thamankar,
J. Molina,
2016
.
L. Larcher,
A. Padovani,
F. Puglisi,
2018
.
H. Wong,
K. Pey,
N. Raghavan,
2017
.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
Pooi See Lee,
D. Chi,
K. Pey,
2005
.
K. Pey,
C. Tung,
B. Fox,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
L. Larcher,
A. Padovani,
F. Puglisi,
2019,
IEEE Electron Device Letters.
F. Puglisi,
P. Pavan,
K. Pey,
2022,
ACS Applied Electronic Materials.
W. K. Choi,
C. Maiti,
D. Antoniadis,
2001
.
J. Suñé,
K. Pey,
N. Raghavan,
2016
.
Xing Wu,
X. Wu,
K. Pey,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
H. Iwai,
K. Pey,
K. Kakushima,
2009,
2009 IEEE International Reliability Physics Symposium.
K. Pey,
A. Ranjan,
J. Molina,
2017
.
T. Kauerauf,
X. Wu,
K. Pey,
2011
.
M. Mackenzie,
K. Pey,
C. Tung,
2007
.
D. Sohn,
K. Pey,
A. Heryanto,
2009,
2009 IEEE International Interconnect Technology Conference.
Pooi See Lee,
D. Chi,
K. Pey,
2008
.
K. Pey,
J. Chai,
D. Chua,
2001
.
H. Iwai,
K. Pey,
K. Kakushima,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. Pey,
A. Wee,
C. Troadec,
2007
.
Pooi See Lee,
J. Ding,
D. Chi,
2002
.
K. Pey,
C. Tung,
D. Ang,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
K. Pey,
W. Lin,
C. Tung,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
C. S. Tan,
D. Antoniadis,
E. Fitzgerald,
2011
.
C. S. Tan,
D. Antoniadis,
E. Fitzgerald,
2010
.
K. Pey,
S. Y. Chiam,
Hailang Qin,
2012
.
K. Pey,
Y. Lee,
P.S. Lee,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
K. Pey,
Y. K. Lim,
L. Hsia,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
G. Lo,
Gang Zhang,
K. Pey,
2008
.
W. K. Choi,
C. Thompson,
K. Pey,
2007
.
K. Pey,
C. Tung,
V. Lo,
2008
.
W. K. Choi,
C. Thompson,
K. Pey,
2003
.
G. Bersuker,
Runsheng Wang,
P. Hao,
2018,
2018 China Semiconductor Technology International Conference (CSTIC).
W. K. Choi,
D. Chi,
D. Antoniadis,
2006
.
K. Pey,
N. Raghavan,
S. O’Shea,
2022,
Scientific Reports.
L. Larcher,
A. Padovani,
F. Puglisi,
2017
.
G. Groeseneken,
K. Pey,
S. De Gendt,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
K. Pey,
N. Raghavan,
S. O’Shea,
2019,
2019 8th International Symposium on Next Generation Electronics (ISNE).
K. Pey,
W. Lin,
C. Tung,
2004,
IEEE Transactions on Device and Materials Reliability.
G. Groeseneken,
K. Pey,
S. Gendt,
2005
.
Pooi See Lee,
S. Balakumar,
K. Pey,
2009
.
Pooi See Lee,
S. Balakumar,
K. Pey,
2008
.
Pooi See Lee,
K. Pey,
G. Lim,
2007
.
K. Pey,
L. Gan,
T. H. Chieng,
1996
.
K. Pey,
S. Ng,
L. Gan,
1996
.
Pooi See Lee,
A. See,
J. Ding,
2000
.
H. Wong,
E. Pop,
M. Lanza,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
K. Pey,
S. Ng,
L. Gan,
1996
.
K. Pey,
S. Ng,
L. Gan,
1995
.
Kin Leong Pey,
Rohit Karnik,
Siu Fung Yu,
2013,
Nature Communications.
K. H. Lee,
S. Chua,
K. Pey,
1998
.
Monitoring of TiSi/sub 2/ formation on narrow polycrystalline silicon lines using Raman spectroscopy
K. Lee,
H. Wong,
S. Chua,
1998,
IEEE Electron Device Letters.
A. See,
Y. Chong,
K. Pey,
2001
.
D. Chi,
K. Pey,
D. Mangelinck,
2001,
IEEE Electron Device Letters.
S. K. Lahiri,
Pooi See Lee,
D. Chi,
2001
.
Pooi See Lee,
K. Pey,
G. Lim,
2006
.
K. Pey,
S. Siah,
W. Lai,
2000
.
Pooi See Lee,
G. Lo,
D. Chi,
2008
.
W. D. Wang,
Pooi See Lee,
D. Chi,
2006
.
D. Chi,
K. Pey,
L.J. Tang,
2006,
IEEE Electron Device Letters.
Pooi See Lee,
D. Chi,
K. Pey,
2005,
cond-mat/0510230.
Pooi See Lee,
K. Pey,
G. Lim,
2007
.
K. Pey,
G. Lim,
F. L. Chow,
2006,
2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors.
Dimitri A. Antoniadis,
Kin Leong Pey,
Eugene A. Fitzgerald,
2004
.
Pooi See Lee,
W. K. Choi,
D. Antoniadis,
2002
.
Dimitri A. Antoniadis,
Kin Leong Pey,
Eugene A. Fitzgerald,
2002
.
Pooi See Lee,
K. Pey,
C. Tung,
2006
.
Pooi See Lee,
K. Pey,
Y. Li,
2004
.
W. K. Choi,
K. Pey,
L. Bera,
2000
.
W. K. Choi,
S. Chua,
K. Pey,
2000
.
K. Pey,
C. Gan,
W. Chim,
2000
.
S. K. Lahiri,
K. H. Lee,
K. Pey,
1999
.
C. K. Maiti,
W. K. Choi,
D. Antoniadis,
2005
.
W. K. Choi,
D. Chi,
D. Antoniadis,
2004
.
Pooi See Lee,
A. See,
J. Ding,
1999
.
A. See,
D. Chi,
K. Pey,
2001
.
Pooi See Lee,
J. Ding,
K. Pey,
1999
.
A. Padovani,
K. Pey,
Y. Ang,
2023,
ACS Applied Electronic Materials.
Norman Tiong Seng Lee,
K. Pey,
Oka Kurniawan,
2022,
ASCILITE Publications.
K. Pey,
N. Raghavan,
M. Bosman,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Thompson,
E. Fitzgerald,
K. Pey,
2009
.
K. Pey,
C. Tung,
D. Ang,
2008
.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
Chee Lip Gan,
Kin Leong Pey,
Carl V. Thompson,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
S. Hau-Riege,
W. K. Choi,
C. Thompson,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Chee Lip Gan,
Kin Leong Pey,
Carl V. Thompson,
2001
.
C. Thompson,
K. Pey,
C. Gan,
2012
.
Pooi See Lee,
Y. Chong,
K. Pey,
2006
.
K. Pey,
Zexiang Shen,
H. Zheng,
2010
.
Chee Lip Gan,
Nagarajan Raghavan,
Kin Leong Pey,
2011
.
J. Yang,
S. Menzel,
R. Waser,
2021,
ACS nano.
K. Pey,
J. Phang,
David Chang,
1992
.
K. Pey,
D. Chan,
J. Phang,
1992
.
K. Pey,
H. Zheng,
X. Wang,
2009
.
Y. Chong,
K. Pey,
A. Wee,
2006
.
Pooi See Lee,
Y. Chong,
K. Pey,
2006
.
A. See,
Y. Chong,
K. Pey,
2000
.
G. Lo,
Gang Zhang,
K. Pey,
2009
.
Nagarajan Raghavan,
Jordi Suñé,
H.-S. Philip Wong,
2018,
Advanced Electronic Materials.
W. K. Choi,
D. Chi,
D. Antoniadis,
2004
.
Kin Leong Pey,
Lay Kee Ang,
K. Pey,
2007
.
Pooi See Lee,
K. Pey,
D. Mangelinck,
2004
.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Kin Leong Pey,
Chih-Hang Tung,
K. Pey,
2008
.
Hiroshi Iwai,
Nagarajan Raghavan,
Kuniyuki Kakushima,
2011
.
Nagarajan Raghavan,
Alok Ranjan,
Kin Leong Pey,
2016,
Microelectron. Reliab..
Nagarajan Raghavan,
K. L. Pey,
K. Pey,
2015
.
Hiroshi Iwai,
Kuniyuki Kakushima,
Michel Bosman,
2014
.
Nagarajan Raghavan,
Kin Leong Pey,
Kalya Shubhakar,
2014,
Microelectron. Reliab..
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2013
.
Kin Leong Pey,
N. Raghavan,
K. Shubhakar,
2013,
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS).
K. Kakushima,
H. Iwai,
Z. R. Wang,
2011,
2011 International Reliability Physics Symposium.
Modified Percolation Model for Polycrystalline High-$ \kappa$ Gate Stack With Grain Boundary Defects
K. Pey,
N. Raghavan,
M. Bosman,
2011,
IEEE Electron Device Letters.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2010
.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
Hiroshi Iwai,
Cedric Troadec,
Kuniyuki Kakushima,
2007
.
K. Pey,
H. Zheng,
X. Wang,
2010
.
W. K. Choi,
D. Antoniadis,
E. Fitzgerald,
2009
.
K. Pey,
Hailang Qin,
C. Troadec,
2012
.
A. See,
Y. Chong,
K. Pey,
2001
.
A. See,
Y. Chong,
K. Pey,
2002
.
Pooi See Lee,
Y. Chong,
K. Pey,
2004
.
K. Pey,
K. Loh,
M. Jaiswal,
2013
.
K. Pey,
Hailang Qin,
C. Troadec,
2012
.
Y. Ong,
K. Pey,
A. Wee,
2008
.
D. Chi,
K. Pey,
K. Tan,
2008
.
Chee Lip Gan,
Kin Leong Pey,
Carl V. Thompson,
2003
.
N. Raghavan,
X. Wu,
X. Li,
2009,
Proceedings of the 2009 12th International Symposium on Integrated Circuits.
W. K. Choi,
D. Chi,
D. Antoniadis,
2006
.
K. Pey,
N. Raghavan,
M. Bosman,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
X. Wu,
K. Pey,
N. Raghavan,
2013,
2013 IEEE International Conference of Electron Devices and Solid-state Circuits.
K. Pey,
R. S. Kajen,
C. Vijila,
2012
.
K. Leong,
C. S. Tan,
Zhixian Chen,
2012
.
Pooi See Lee,
K. Pey,
C. W. Tan,
2006
.
W. K. Choi,
D. Chi,
D. Antoniadis,
2005
.
W. K. Choi,
D. Antoniadis,
M. Lee,
2005
.
N. Singh,
G. Lo,
D. Chi,
2008,
IEEE Electron Device Letters.
K. Leong,
N. Singh,
G. Lo,
2012
.
Pooi See Lee,
J. Ding,
K. Pey,
2002
.
Pooi See Lee,
A. See,
J. Ding,
2002
.
N. Singh,
G. Lo,
K. Pey,
2009,
IEEE Electron Device Letters.
Pooi See Lee,
K. Pey,
N. Toledo,
2004
.
K. Pey,
T. Osipowicz,
J. Ye,
2002
.
Kin Leong Pey,
D. A. Antoniadis,
Eugene A. Fitzgerald,
2006
.
K. Pey,
J. Ye,
S. Chooi,
2001
.
Pooi See Lee,
A. See,
J. Ding,
2002
.
Xing Wu,
Nagarajan Raghavan,
Michel Bosman,
2015
.
W. K. Choi,
D. Chi,
D. Antoniadis,
2005
.
M. K. Dawood,
W. K. Choi,
D. Chi,
2007,
IEEE Electron Device Letters.
K. Pey,
A. Wee,
D. Mangelinck,
2000
.
Pooi See Lee,
N. Singh,
G. Lo,
2008,
IEEE Electron Device Letters.
D. Chi,
K. Pey,
D. Mangelinck,
2000
.
Pooi See Lee,
D. Chi,
K. Pey,
2004
.
K. Pey,
C. Gan,
C.S. Ho,
1999,
Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).
K. Pey,
C. S. Ho,
S. Siah,
1999
.
E. Fitzgerald,
K. Pey,
Qing Zhang,
2014
.
Nagarajan Raghavan,
Alok Ranjan,
Michel Bosman,
2016,
Microelectron. Reliab..
Xing Wu,
Nagarajan Raghavan,
Michel Bosman,
2013
.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2011
.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2011
.
Xing Wu,
Kin Leong Pey,
Xing Wu,
2011,
IEEE Electron Device Letters.
L. Larcher,
A. Padovani,
L. Vandelli,
2011
.
Kin Leong Pey,
Chih-Hang Tung,
K. Pey,
2008
.
G. H. See,
K. Pey,
Xing Zhou,
2010,
IEEE Transactions on Electron Devices.
K. Pey,
Xing Zhou,
G. Zhu,
2010
.
Pooi See Lee,
Y. Chong,
K. Pey,
2004
.
N. Raghavan,
X. Li,
K. Pey,
2010,
2010 IEEE International Reliability Physics Symposium.
K. Pey,
S. O’Shea,
A. Ranjan,
2019,
The Review of scientific instruments.
A. See,
K. Pey,
Y.K. Lim,
2004,
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).
Daniel D. Frey,
Nagarajan Raghavan,
Michel Bosman,
2014,
2014 IEEE International Reliability Physics Symposium.
Nagarajan Raghavan,
Kin Leong Pey,
Kalya Shubhakar,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Nagarajan Raghavan,
Kin Leong Pey,
J. H. Lim,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
W. J. Liu,
K. Pey,
Q. Zhang,
2011,
IEEE Electron Device Letters.
W. J. Liu,
H. Hu,
K. Pey,
2010,
2010 International Electron Devices Meeting.
Nagarajan Raghavan,
Kin Leong Pey,
Andrea Padovani,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
K. Yamane,
N. Raghavan,
K.L. Pey,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Daniel D. Frey,
Nagarajan Raghavan,
Michel Bosman,
2014,
Microelectron. Reliab..
Nagarajan Raghavan,
Kin Leong Pey,
Andrea Padovani,
2013,
IEEE Electron Device Letters.
K. Pey,
N. Raghavan,
M. Bosman,
2020,
ACS applied materials & interfaces.
C. C. Wong,
K. Pey,
Lei Liu,
2004
.
Rajesh Elara Mohan,
Daniel D. Frey,
Kristin L. Wood,
2012
.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2015,
2015 IEEE International Reliability Physics Symposium.
L. Larcher,
G. Bersuker,
D. S. Ang,
2010,
2010 IEEE International Reliability Physics Symposium.
N. Raghavan,
K.L. Pey,
M. Bosman,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Kin Leong Pey,
K. Pey,
D. Chan,
1993
.
D. Chi,
K. Pey,
K. Tan,
2009
.
K. L. Pey,
N. Raghavan,
S. Mei,
2018,
IEEE Transactions on Electron Devices.
Daniel D. Frey,
Nagarajan Raghavan,
Michel Bosman,
2015,
2015 IEEE International Reliability Physics Symposium.
M.K. Radhakrishnan,
Lei Jun Tang,
K.L. Pey,
2004,
IEEE Transactions on Device and Materials Reliability.
Zheng Fang,
Z. Fang,
Hongyu Yu,
2009,
Proceedings of the 2009 12th International Symposium on Integrated Circuits.
Kin Leong Pey,
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